Abstract
This paper explores the fault tolerant capabilities of an Embedded Enhanced-Boost Z-Source Inverter (EEB-ZSI) for PV applications. Compared with the prior-art Embedded Source Inverters (E-ZSI) and Enhanced-Boost Z-Source Inverter (EB-ZSI), the proposed topology features that when one dc source (e.g., PV panel) is short-circuited (SC) or open-circuited (OC), the inverter can tolerate the faults and still operate with a compromised conversion ratio. However, the conversion ratio is still larger than the traditional E-ZSI. This topology can be further applied to the cascaded H-bridge inverter systems for multi-level applications with fault-handling capabilities. A detailed fault-tolerant analysis is conducted on the EEB-ZSI and simulations are provided to validate the analysis.
Originalsprog | Engelsk |
---|---|
Titel | Proceedings of IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society |
Antal sider | 6 |
Forlag | IEEE |
Publikationsdato | okt. 2018 |
Sider | 3712-3717 |
Artikelnummer | 8591424 |
ISBN (Trykt) | 978-1-5090-6685-8 |
ISBN (Elektronisk) | 978-1-5090-6684-1 |
DOI | |
Status | Udgivet - okt. 2018 |
Begivenhed | 44th Annual Conference of the IEEE Industrial Electronics Society - Omni Shoreham Hotel, Washington, USA Varighed: 21 okt. 2018 → 23 okt. 2018 http://www.iecon2018.org/ |
Konference
Konference | 44th Annual Conference of the IEEE Industrial Electronics Society |
---|---|
Lokation | Omni Shoreham Hotel |
Land/Område | USA |
By | Washington |
Periode | 21/10/2018 → 23/10/2018 |
Internetadresse |