Current measurement method for characterization of fast switching power semiconductors with Silicon Steel Current Transformer

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

26 Citationer (Scopus)

Abstract

This paper proposes a novel current measurement method with Silicon Steel Current Transformer (SSCT) for the characterization of fast switching power semiconductors. First, the existing current sensors for characterization of fast switching power semiconductors are experimentally evaluated regarding three essential qualities: high bandwidth, suitable physical size, and galvanic isolation. Then, the proposed current measurement method with SSCT is mathematically analyzed, which proves that the proposed method has the capability of measuring fast switching current. Simultaneously, it compensates the mechanical size limitations of the Pearson current monitor. Finally, experimental studied are carried out with both discrete Silicon Carbide (SiC) MOSFET and high current (1000A) Silicon (Si) IGBT power modules. The experimental results validate the effectiveness of the proposed method.
OriginalsprogEngelsk
TitelProceedings of the 2015 IEEE Applied Power Electronics Conference and Exposition (APEC)
Antal sider5
ForlagIEEE Press
Publikationsdatomar. 2015
Sider2527 - 2531
ISBN (Trykt)978-1-4799-6735-3
DOI
StatusUdgivet - mar. 2015
Begivenhed30th Annual IEEE Applied Power Electronics Conference and Exposition - Charlotte, USA
Varighed: 15 mar. 201519 mar. 2015

Konference

Konference30th Annual IEEE Applied Power Electronics Conference and Exposition
Land/OmrådeUSA
ByCharlotte
Periode15/03/201519/03/2015
NavnI E E E Applied Power Electronics Conference and Exposition. Conference Proceedings
ISSN1048-2334

Fingeraftryk

Dyk ned i forskningsemnerne om 'Current measurement method for characterization of fast switching power semiconductors with Silicon Steel Current Transformer'. Sammen danner de et unikt fingeraftryk.

Citationsformater