Degradation mapping in high power IGBT modules using four-point probing

Kristian Bonderup Pedersen, Lotte Haxen Østergaard, Pramod Ghimire, Vladimir Popok, Kjeld Pedersen

Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review

16 Citationer (Scopus)

Originalsprog	Engelsk
Tidsskrift	Microelectronics Reliability
Vol/bind	55
Udgave nummer	8
Sider (fra-til)	1196-1204
ISSN	0026-2714
DOI	https://doi.org/10.1016/j.microrel.2015.05.011
Status	Udgivet - jul. 2015

Adgang til dokumentet

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title = "Degradation mapping in high power IGBT modules using four-point probing",

author = "Pedersen, {Kristian Bonderup} and {Haxen {\O}stergaard}, Lotte and Pramod Ghimire and Vladimir Popok and Kjeld Pedersen",

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AU - Pedersen, Kristian Bonderup

AU - Haxen Østergaard, Lotte

AU - Ghimire, Pramod

AU - Popok, Vladimir

AU - Pedersen, Kjeld

PY - 2015/7

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EP - 1204

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JF - Microelectronics Reliability

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