Abstract
Traffic light detection (TLD) is a vital part of both intel- ligent vehicles and driving assistance systems (DAS). Gen- eral for most TLDs is that they are evaluated on small and private datasets making it hard to determine the exact per- formance of a given method. In this paper we apply the state-of-the-art, real-time object detection system You Only Look Once, (YOLO) on the public LISA Traffic Light dataset available through the VIVA-challenge, which contain a high number of annotated traffic lights, captured in varying light and weather conditions.
The YOLO object detector achieves an AUC of impres- sively 90.49 % for daysequence1, which is an improvement of 50.32 % compared to the latest ACF entry in the VIVA- challenge. Using the exact same training configuration as the ACF detector, the YOLO detector reaches an AUC of 58.3 %, which is in an increase of 18.13 %.
The YOLO object detector achieves an AUC of impres- sively 90.49 % for daysequence1, which is an improvement of 50.32 % compared to the latest ACF entry in the VIVA- challenge. Using the exact same training configuration as the ACF detector, the YOLO detector reaches an AUC of 58.3 %, which is in an increase of 18.13 %.
Originalsprog | Engelsk |
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Titel | 2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops : Traffic Surveillance Workshop and Challenge |
Forlag | IEEE |
Publikationsdato | 21 jul. 2017 |
ISBN (Trykt) | 978-1-5386-0734-3 |
ISBN (Elektronisk) | 978-1-5386-0733-6 |
DOI | |
Status | Udgivet - 21 jul. 2017 |
Begivenhed | 2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops: Traffic Surveillance Workshop and Challenge - Hawaii Convention Center, Honolulu, USA Varighed: 21 jul. 2017 → 26 jul. 2017 |
Konference
Konference | 2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops: Traffic Surveillance Workshop and Challenge |
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Lokation | Hawaii Convention Center |
Land/Område | USA |
By | Honolulu |
Periode | 21/07/2017 → 26/07/2017 |
Navn | IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) |
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ISSN | 2160-7516 |