Finite Set MPC Algorithm for Achieving Thermal Redistribution in a Neutral-Point-Clamped Converter

Mateja Novak, Tomislav Dragicevic, Frede Blaabjerg

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13 Citationer (Scopus)
228 Downloads (Pure)

Abstract

The three level neutral-point clamped (3L-NPC) topology is one of the most widely used multilevel topologies in the low and medium voltage applications and also one of the most commercialized topologies. Although it offers many benefits compared to the conventional two level topology, it suffers from a considerable unequal loss distribution among the inner and outer switches and the clamping diodes. To solve this problem, we are proposing a control algorithm based on the finite control set model predictive control (FCS-MPC) that can provide a more balanced stress distribution. For implementing the proposed control algorithm no additional measurements are required nor thermal models of the semiconductor devices. The algorithm benefits are even more noticeable during low voltage ride through (LVRT) scenarios when the output voltage level of the converter is low and the current amplitude is high. Obtained simulation results confirm the positive effects on the thermal redistribution and also the junction temperatures of the most stressed devices are reduced. Effects of the algorithm are also verified on an experimental set-up.
OriginalsprogEngelsk
TitelProceedings of IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society
Antal sider7
ForlagIEEE Press
Publikationsdatookt. 2018
Sider5290-5296
ISBN (Trykt)978-1-5090-6685-8
ISBN (Elektronisk)978-1-5090-6684-1
DOI
StatusUdgivet - okt. 2018
Begivenhed44th Annual Conference of the IEEE Industrial Electronics Society - Omni Shoreham Hotel, Washington, USA
Varighed: 21 okt. 201823 okt. 2018
http://www.iecon2018.org/

Konference

Konference44th Annual Conference of the IEEE Industrial Electronics Society
LokationOmni Shoreham Hotel
Land/OmrådeUSA
ByWashington
Periode21/10/201823/10/2018
Internetadresse
NavnProceedings of the Annual Conference of the IEEE Industrial Electronics Society
ISSN1553-572X

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