Fuse Modeling for Reliability Study of Power Electronic Circuits

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Abstract

This paper describes a comprehensive modeling approach on reliability of fuses used in power electronic circuits. When fuses are subjected to current pulses, cyclic temperature stress is introduced to the fuse element and will wear out the component. Furthermore, the fuse may be used in a large variation of ambient temperature, e.g. in deserts and the accumulated damage in the fuse elements is gradually increasing due to thermo-mechanical stress that results in resistance increase and further unexpected failures. Consequently, the electrical characteristics of the fuse like I2t, breaking capacity, and rated voltage/current are opposed to shift in time to effect early breaking during the normal operation of the circuit. Therefore, in such cases, a reliable protection required for the other circuit components will not be achieved. The thermo-mechanical models, fatigue analysis and thermo-electrical models of fuses are presented by FEM simulations in order to identify the important factors affecting the performance of fuses at different ambient temperatures and cycling operation.
OriginalsprogEngelsk
TitelProceedings of the 2017 IEEE Applied Power Electronics Conference and Exposition (APEC)
Antal sider8
ForlagIEEE Press
Publikationsdatomar. 2017
Sider829-836
ISBN (Trykt)978-1-5090-5366-7
DOI
StatusUdgivet - mar. 2017
Begivenhed2017 IEEE Applied Power Electronics Conference and Exposition (APEC) - Tampa Convention Center, Tampa, FL, USA
Varighed: 26 mar. 201730 mar. 2017

Konference

Konference2017 IEEE Applied Power Electronics Conference and Exposition (APEC)
LokationTampa Convention Center
Land/OmrådeUSA
ByTampa, FL
Periode26/03/201730/03/2017
NavnIEEE Applied Power Electronics Conference and Exposition (APEC)
ISSN2470-6647

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