Investigation on the Short-Circuit Behavior of an Aged IGBT Module Through a 6 kA/1.1 kV Non-Destructive Testing Equipment

Rui Wu, Liudmila Smirnova, Francesco Iannuzzo, Huai Wang, Frede Blaabjerg

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10 Citationer (Scopus)
1847 Downloads (Pure)

Abstract

This paper describes the design and development of a 6 kA/1.1 kV non-destructive testing system, which aims for short circuit testing of high-power IGBT modules. An ultralow stray inductance of 37 nH is achieved in the implementation of the tester. An 100 MHz FPGA supervising unit enables 10 ns level control accuracy of the short-circuit duration, protection triggering, and acquisition of the electrical waveform. Moreover, a protection circuit avoids explosions in case of failure, making the post-failure analysis possible. A case study has been carried out on an aged 1.7 kV IGBT power module. The case study shows the current and voltage waveform during short-circuit, as well as the current mismatch among six inner sections, which demonstrate the capability and the effectiveness of the proposed setup in the short-circuit aspect reliability studies of MW-scale power modules.
OriginalsprogEngelsk
TitelProceedings of the 40th Annual Conference of the IEEE Industrial Electronics Society, IECON 2014
Antal sider7
ForlagIEEE Press
Publikationsdatonov. 2014
Sider3367-3373
DOI
StatusUdgivet - nov. 2014
Begivenhed40th Annual Conference of IEEE Industrial Electronics Society - Dallas, TX, USA
Varighed: 29 okt. 20141 nov. 2014

Konference

Konference40th Annual Conference of IEEE Industrial Electronics Society
Land/OmrådeUSA
ByDallas, TX
Periode29/10/201401/11/2014
NavnProceedings of the Annual Conference of the IEEE Industrial Electronics Society
ISSN1553-572X

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