Reliability evaluation of an impedance-source PV microconverter

Yanfeng Shen, Elizaveta Liivik, Frede Blaabjerg, Dmitri Vinnikov, Huai Wang, Andrii Chub

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9 Citationer (Scopus)

Abstract

The reliability of an impedance-source PV microconverter is evaluated based on the real-field mission profile. As part of a PV microinverter, the dc-dc microconverter is firstly described. Then the electro-thermal and lifetime models are built for the most reliability-critical components, i.e., the power semiconductor devices and capacitors. The finite element method (FEM) simulation is used for the thermal impedance extraction. The mission profile, i.e., the ambient temperature and solar irradiance, from Aalborg, Denmark is applied to the built electrothermal model. Finally, the thermal loading profiles and annual wear-out damage accumulation are obtained. In addition, experimental measurements from a 300-W converter prototype are given.
OriginalsprogEngelsk
Titel2018 IEEE Applied Power Electronics Conference and Exposition (APEC)
Antal sider5
ForlagIEEE Press
Publikationsdatomar. 2018
Sider1104-1108
ISBN (Trykt)978-1-5386-1179-1, 978-1-5386-1181-4
ISBN (Elektronisk)978-1-5386-1180-7
DOI
StatusUdgivet - mar. 2018
Begivenhed2018 IEEE Applied Power Electronics Conference and Exposition (APEC) - San Antonio, USA
Varighed: 4 mar. 20188 mar. 2018

Konference

Konference2018 IEEE Applied Power Electronics Conference and Exposition (APEC)
Land/OmrådeUSA
BySan Antonio
Periode04/03/201808/03/2018
NavnIEEE Applied Power Electronics Conference and Exposition (APEC)
ISSN2470-6647

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