Abstract
High reliability performance of microinverters in Photovoltaic (PV) systems is a merit to match lifetime with PV panels, and to reduce the required maintenance efforts and costs. This digest applies a reliability oriented design method for a grid-connected PV microinverter to achieve specific lifetime requirement. Reliability allocation is performed from system-level requirement to component-level reliability design target. Special attentions are paid to reliability-critical components, e.g., GaN HEMTs and the dc-link aluminum electrolytic capacitor. A design flow chart, including key steps of mission profile based long-term stress analysis, lifetime predication, and reliability modeling are presented. A case study of a 300 W two-stage PV microinverter is used to demonstrate the effectiveness of the design method.
| Originalsprog | Engelsk |
|---|---|
| Titel | Proceedings of the 2017 IEEE 3rd International Future Energy Electronics Conference and ECCE Asia (IFEEC 2017 - ECCE Asia) |
| Antal sider | 6 |
| Forlag | IEEE Press |
| Publikationsdato | jun. 2017 |
| Sider | 81-86 |
| ISBN (Trykt) | 978-1-5090-5157-1 |
| DOI | |
| Status | Udgivet - jun. 2017 |
| Begivenhed | 2017 IEEE 3rd International Future Energy Electronics Conference and ECCE Asia (IFEEC 2017 - ECCE Asia) - Kaohsiung, Taiwan Varighed: 3 jun. 2017 → 7 jun. 2017 |
Konference
| Konference | 2017 IEEE 3rd International Future Energy Electronics Conference and ECCE Asia (IFEEC 2017 - ECCE Asia) |
|---|---|
| Land/Område | Taiwan |
| By | Kaohsiung |
| Periode | 03/06/2017 → 07/06/2017 |