Role of parasitic capacitances in power MOSFET turn-on switching speed limits: A SiC case study

Davide Cittanti, Francesco Iannuzzo, Eckart Hoene, Kirill Klein

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

29 Citationer (Scopus)

Abstract

This paper describes the effect of MOSFET internal capacitances on the channel current during the turn-on switching transition: an intrinsic theoretical switching speed limit is found and detailed mathematically. The set of analytical equations is solved and the effect of the displacement currents is highlighted with ideal simulated waveforms. A laboratory experiment is thus performed, in order to prove the theoretical predictions: a 25 mΩ SiC CREE power MOSFET is turned on in a no-load condition (zero drain current), starting from different drain-source voltage values. Finally, a LTSpice equivalent circuit model is also built, to better simulate the experimental behavior of the device, adding circuit strain components and other non-idealities to the overall model. A good match between measurements and simulations is observed, mostly validating either the theoretical assumptions and the presented model.
OriginalsprogEngelsk
TitelProceedings of 2017 IEEE Energy Conversion Congress and Exposition (ECCE)
ForlagIEEE Press
Publikationsdatookt. 2017
ISBN (Elektronisk)978-1-5090-2998-3
DOI
StatusUdgivet - okt. 2017
Begivenhed2017 IEEE Energy Conversion Congress and Exposition (ECCE) - Cincinnati, Ohio, USA
Varighed: 1 okt. 20175 okt. 2017

Konference

Konference2017 IEEE Energy Conversion Congress and Exposition (ECCE)
Land/OmrådeUSA
ByCincinnati, Ohio
Periode01/10/201705/10/2017

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