Vce-based methods for temperature estimation of high power IGBT modules during power cycling  - A comparison

Anastasios Amoiridis; Anup Anurag; Pramod Ghimire; Stig Munk-Nielsen; Nick Baker

doi:10.1109/EPE.2015.7309449

Vce-based methods for temperature estimation of high power IGBT modules during power cycling - A comparison

Anastasios Amoiridis, Anup Anurag, Pramod Ghimire, Stig Munk-Nielsen, Nick Baker

AAU Energi

Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review

21 Citationer (Scopus)

Abstract

Temperature estimation is of great importance for performance and reliability of IGBT power modules in converter operation as well as in active power cycling tests. It is common to be estimated through Thermo-Sensitive Electrical Parameters such as the forward voltage drop (Vce) of the chip. This experimental work evaluates the validity and accuracy of two Vce based methods applied on high power IGBT modules during power cycling tests. The first method estimates the chip temperature when low sense current is applied and the second method when normal load current is present. Finally, a correction factor that eliminates the series resistance contribution on the Vce measured at high current, is proposed.

Originalsprog	Engelsk
Titel	Proceedings of the 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe)
Antal sider	9
Forlag	IEEE Press
Publikationsdato	sep. 2015
DOI	https://doi.org/10.1109/EPE.2015.7309449
Status	Udgivet - sep. 2015
Begivenhed	17th European Conference on Power Electronics and Applications, EPE-ECCE Europe 2015 - Centre International de Conférence Genève (CICG), 17 rue Varembé CH . 1211 Genève 20, Geneva, Schweiz Varighed: 8 sep. 2015 → 10 sep. 2015

Konference

Konference	17th European Conference on Power Electronics and Applications, EPE-ECCE Europe 2015
Lokation	Centre International de Conférence Genève (CICG), 17 rue Varembé CH . 1211 Genève 20
Land/Område	Schweiz
By	Geneva
Periode	08/09/2015 → 10/09/2015

Adgang til dokumentet

10.1109/EPE.2015.7309449

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Citationsformater

@inproceedings{ed04d216fdc0433f906eca4b74b7a77e,

title = "Vce-based methods for temperature estimation of high power IGBT modules during power cycling - A comparison",

abstract = "Temperature estimation is of great importance for performance and reliability of IGBT power modules in converter operation as well as in active power cycling tests. It is common to be estimated through Thermo-Sensitive Electrical Parameters such as the forward voltage drop (Vce) of the chip. This experimental work evaluates the validity and accuracy of two Vce based methods applied on high power IGBT modules during power cycling tests. The first method estimates the chip temperature when low sense current is applied and the second method when normal load current is present. Finally, a correction factor that eliminates the series resistance contribution on the Vce measured at high current, is proposed.",

keywords = "IGBT high power modules, Chip temperature, Power cycling, Vce measurement, IR thermography",

author = "Anastasios Amoiridis and Anup Anurag and Pramod Ghimire and Stig Munk-Nielsen and Nick Baker",

year = "2015",

month = sep,

doi = "10.1109/EPE.2015.7309449",

language = "English",

booktitle = "Proceedings of the 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe)",

publisher = "IEEE Press",

note = "17th European Conference on Power Electronics and Applications, EPE-ECCE Europe 2015, IEEE ECCE-EPE 2015 ; Conference date: 08-09-2015 Through 10-09-2015",

}

Amoiridis, A, Anurag, A, Ghimire, P, Munk-Nielsen, S & Baker, N 2015, Vce-based methods for temperature estimation of high power IGBT modules during power cycling - A comparison. i Proceedings of the 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe). IEEE Press, 17th European Conference on Power Electronics and Applications, EPE-ECCE Europe 2015, Geneva, Schweiz, 08/09/2015. https://doi.org/10.1109/EPE.2015.7309449

Vce-based methods for temperature estimation of high power IGBT modules during power cycling - A comparison. / Amoiridis, Anastasios; Anurag, Anup; Ghimire, Pramod et al.
Proceedings of the 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe). IEEE Press, 2015.

Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review

TY - GEN

T1 - Vce-based methods for temperature estimation of high power IGBT modules during power cycling - A comparison

AU - Amoiridis, Anastasios

AU - Anurag, Anup

AU - Ghimire, Pramod

AU - Munk-Nielsen, Stig

AU - Baker, Nick

PY - 2015/9

Y1 - 2015/9

N2 - Temperature estimation is of great importance for performance and reliability of IGBT power modules in converter operation as well as in active power cycling tests. It is common to be estimated through Thermo-Sensitive Electrical Parameters such as the forward voltage drop (Vce) of the chip. This experimental work evaluates the validity and accuracy of two Vce based methods applied on high power IGBT modules during power cycling tests. The first method estimates the chip temperature when low sense current is applied and the second method when normal load current is present. Finally, a correction factor that eliminates the series resistance contribution on the Vce measured at high current, is proposed.

AB - Temperature estimation is of great importance for performance and reliability of IGBT power modules in converter operation as well as in active power cycling tests. It is common to be estimated through Thermo-Sensitive Electrical Parameters such as the forward voltage drop (Vce) of the chip. This experimental work evaluates the validity and accuracy of two Vce based methods applied on high power IGBT modules during power cycling tests. The first method estimates the chip temperature when low sense current is applied and the second method when normal load current is present. Finally, a correction factor that eliminates the series resistance contribution on the Vce measured at high current, is proposed.

KW - IGBT high power modules

KW - Chip temperature

KW - Power cycling

KW - Vce measurement

KW - IR thermography

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U2 - 10.1109/EPE.2015.7309449

DO - 10.1109/EPE.2015.7309449

M3 - Article in proceeding

BT - Proceedings of the 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe)

PB - IEEE Press

T2 - 17th European Conference on Power Electronics and Applications, EPE-ECCE Europe 2015

Y2 - 8 September 2015 through 10 September 2015

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