The overall goal of the project is to devise a strategy for dealing with substrate carried background noise in ultra-wide band systems. Emphasis is on achieving a statistical description of the key characteristics for CMOS device substrate current injection. Based on this, effects of operating frequency, scale and density of CMOS devices must be quantified through simulation and measurement. CMOS test structures must be designed to analyze the noise coupling characteristics. Ultra-wide band circuits must likely be included to verify the devised noise mitigation strategy.