Abstract
This paper proposes an Active Thermal Control (ATC) method for MOS-gated power switches aimed at reducing temperature swing amplitude during operation. It leverages on the fact that thermal cycle amplitude of many actuation system components (such as power devices) has a large impact on the system reliability and lifetime. These figures can then be improved, which eases the adoption of electrification in markets, such as transportation, where they are still below target values. The proposed ATC method leaves electric load parameters untouched, while acting dynamically on gate parameters, namely voltage and resistance. A model-predictive control (MPC) strategy is used to determine the most suitable parameters to use. Simulations of the control scheme are presented first, to predict the potential benefits on temperature swing amplitude, and the consequent improvements in terms of device lifetime are inferred, using literature models. Then, experimental proof of concept is presented and discussed, together with its limitations and drawbacks.
Original language | English |
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Title of host publication | Proceedings of 43rd Annual Conference of the IEEE Industrial Electronics Society, IECON 2017 |
Number of pages | 6 |
Publisher | IEEE Press |
Publication date | Oct 2017 |
Pages | 7935-7940 |
DOIs | |
Publication status | Published - Oct 2017 |
Event | 43rd Annual Conference of the IEEE Industrial Electronics Society, IECON 2017 - Beijing, China Duration: 29 Oct 2017 → 1 Nov 2017 |
Conference
Conference | 43rd Annual Conference of the IEEE Industrial Electronics Society, IECON 2017 |
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Country/Territory | China |
City | Beijing |
Period | 29/10/2017 → 01/11/2017 |
Sponsor | Chinese Association of Automation (CAA), Chinese Power Supply Society, et al., IEEE Industrial Electronics Society (IES), Systems Engineering Society of China, The Institute of Electrical and Electronics Engineers (IEEE) |