Automated Test Generation Timed Automata: Tool and Case Study

Research output: ResearchArticle in proceeding

Details

Original languageEnglish
Title of host publication21st IEEE Real-Time Systems Symposium 2000, Work in Progress-Session, Walt Disney World, Orlando, Florida, USA, November 2000
Publication date2000
StatePublished - 2000
Publication categoryResearch
Peer-reviewedNo
EventAutomated Test Generation Timed Automata -
Duration: 19 May 2010 → …

Conference

ConferenceAutomated Test Generation Timed Automata
Periode19/05/2010 → …
ID: 131377