Automatic detection and evaluation of solar cell micro-cracks in electroluminescence images using matched filters

Sergiu Spataru, Peter Hacke, Dezso Sera

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

38 Citations (Scopus)

Abstract

A method for detecting micro-cracks in solar cells using two dimensional matched filters was developed, derived from the electroluminescence intensity profile of typical micro-cracks. We describe the image processing steps to obtain a binary map with the location of the micro-cracks. Finally, we show how to automatically estimate the total length of each micro-crack from these maps, and propose a method to identify severe types of micro-cracks, such as parallel, dendritic, and cracks with multiple orientations. With an optimized threshold parameter, the technique detects over 90 % of cracks larger than 3 cm in length. The method shows great potential for quantifying micro-crack damage after manufacturing or module transportation for the determination of a module quality criterion for cell cracking in photovoltaic modules.

Original languageEnglish
Title of host publicationProceedings of 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016
Number of pages6
PublisherIEEE Press
Publication dateJun 2016
Pages1602-1607
Article number7749891
ISBN (Electronic)978-1-5090-2724-8
DOIs
Publication statusPublished - Jun 2016
Event43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States
Duration: 5 Jun 201610 Jun 2016

Conference

Conference43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
Country/TerritoryUnited States
CityPortland
Period05/06/201610/06/2016

Keywords

  • Crystalline silicon
  • Detection
  • Electroluminescence
  • Matched filters
  • Micro-crack
  • Photovoltaic cells

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