Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy

Matei-lon Oprea; Sergiu Spataru; Dezso Sera; Peter Behrensdorff Poulsen; Sune Thorsteinsson; Ronni Basu; Anders Andersen; Kenn H. B. Frederiksen

doi:10.1109/PVSC.2016.7749885

Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy

Matei-lon Oprea, Sergiu Spataru, Dezso Sera, Peter Behrensdorff Poulsen, Sune Thorsteinsson, Ronni Basu, Anders Andersen, Kenn H. B. Frederiksen

AAU Energy

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

19 Citations (Scopus)

Abstract

Impedance spectroscopy (IS) is an established characterization method in different electrical and chemical research areas, but not yet adopted as a commercial diagnostic tool for PV panels. This work, for the first time, proposes an IS based method for detecting potential-induced degradation (PID) in c-Si PV panels. The method has been experimentally tested using an automated PID test bed, and the IS results were confirmed using traditional current-voltage characterization methods, as well as electroluminescence imaging. The corroborated results confirm the effectiveness of the new approach to identify PID in PV panels.

Original language	English
Title of host publication	Proceedings of the IEEE 43rd Photovoltaic Specialist Conference (PVSC), 2016
Number of pages	5
Publisher	IEEE Press
Publication date	18 Nov 2016
Pages	1575-1579
Article number	7749885
ISBN (Electronic)	978-1-5090-2724-8
DOIs	https://doi.org/10.1109/PVSC.2016.7749885 https://doi.org/10.1109/PVSC.2016.7749885
Publication status	Published - 18 Nov 2016
Event	43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States Duration: 5 Jun 2016 → 10 Jun 2016

Conference

Conference	43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
Country/Territory	United States
City	Portland
Period	05/06/2016 → 10/06/2016

Keywords

Potential-induced degradation
Photovoltaic modules
Impedance spectroscopy
Fault detection

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Oprea, M., Spataru, S., Sera, D., Poulsen, P. B., Thorsteinsson, S., Basu, R., Andersen, A., & H. B. Frederiksen, K. (2016). Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy. In Proceedings of the IEEE 43rd Photovoltaic Specialist Conference (PVSC), 2016 (pp. 1575-1579). Article 7749885 IEEE Press. https://doi.org/10.1109/PVSC.2016.7749885, https://doi.org/10.1109/PVSC.2016.7749885

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title = "Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy",

abstract = "Impedance spectroscopy (IS) is an established characterization method in different electrical and chemical research areas, but not yet adopted as a commercial diagnostic tool for PV panels. This work, for the first time, proposes an IS based method for detecting potential-induced degradation (PID) in c-Si PV panels. The method has been experimentally tested using an automated PID test bed, and the IS results were confirmed using traditional current-voltage characterization methods, as well as electroluminescence imaging. The corroborated results confirm the effectiveness of the new approach to identify PID in PV panels. ",

keywords = "Potential-induced degradation, Photovoltaic modules, Impedance spectroscopy, Fault detection",

author = "Matei-lon Oprea and Sergiu Spataru and Dezso Sera and Poulsen, {Peter Behrensdorff} and Sune Thorsteinsson and Ronni Basu and Anders Andersen and {H. B. Frederiksen}, Kenn",

year = "2016",

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doi = "10.1109/PVSC.2016.7749885",

language = "English",

pages = "1575--1579",

booktitle = "Proceedings of the IEEE 43rd Photovoltaic Specialist Conference (PVSC), 2016",

publisher = "IEEE Press",

note = "43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 ; Conference date: 05-06-2016 Through 10-06-2016",

}

Oprea, M, Spataru, S, Sera, D, Poulsen, PB, Thorsteinsson, S, Basu, R, Andersen, A & H. B. Frederiksen, K 2016, Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy. in Proceedings of the IEEE 43rd Photovoltaic Specialist Conference (PVSC), 2016., 7749885, IEEE Press, pp. 1575-1579, 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016, Portland, United States, 05/06/2016. https://doi.org/10.1109/PVSC.2016.7749885, https://doi.org/10.1109/PVSC.2016.7749885

Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy. / Oprea, Matei-lon; Spataru, Sergiu; Sera, Dezso et al.
Proceedings of the IEEE 43rd Photovoltaic Specialist Conference (PVSC), 2016. IEEE Press, 2016. p. 1575-1579 7749885.

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

TY - GEN

T1 - Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy

AU - Oprea, Matei-lon

AU - Spataru, Sergiu

AU - Sera, Dezso

AU - Poulsen, Peter Behrensdorff

AU - Thorsteinsson, Sune

AU - Basu, Ronni

AU - Andersen, Anders

AU - H. B. Frederiksen, Kenn

PY - 2016/11/18

Y1 - 2016/11/18

N2 - Impedance spectroscopy (IS) is an established characterization method in different electrical and chemical research areas, but not yet adopted as a commercial diagnostic tool for PV panels. This work, for the first time, proposes an IS based method for detecting potential-induced degradation (PID) in c-Si PV panels. The method has been experimentally tested using an automated PID test bed, and the IS results were confirmed using traditional current-voltage characterization methods, as well as electroluminescence imaging. The corroborated results confirm the effectiveness of the new approach to identify PID in PV panels.

AB - Impedance spectroscopy (IS) is an established characterization method in different electrical and chemical research areas, but not yet adopted as a commercial diagnostic tool for PV panels. This work, for the first time, proposes an IS based method for detecting potential-induced degradation (PID) in c-Si PV panels. The method has been experimentally tested using an automated PID test bed, and the IS results were confirmed using traditional current-voltage characterization methods, as well as electroluminescence imaging. The corroborated results confirm the effectiveness of the new approach to identify PID in PV panels.

KW - Potential-induced degradation

KW - Photovoltaic modules

KW - Impedance spectroscopy

KW - Fault detection

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DO - 10.1109/PVSC.2016.7749885

M3 - Article in proceeding

AN - SCOPUS:85003533277

SP - 1575

EP - 1579

BT - Proceedings of the IEEE 43rd Photovoltaic Specialist Conference (PVSC), 2016

PB - IEEE Press

T2 - 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016

Y2 - 5 June 2016 through 10 June 2016

ER -

Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy

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Fast localization and characterization of faults in solar cell systems

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Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy

Abstract

Conference

Keywords

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Fast localization and characterization of faults in solar cell systems

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