Extraction of temperature dependent interfacial resistance of thermoelectric modules

Min Chen

Research output: Contribution to journalJournal articleResearchpeer-review

9 Citations (Scopus)

Abstract

This article discusses an approach for extracting the temperature dependency of the electrical interfacial resistance associated with thermoelectric devices. The method combines a traditional module-level test rig and a nonlinear numerical model of thermoelectricity to minimize measurement errors on the interfacial resistance. The extracted results represent useful data to investigating the characteristics of thermoelectric module resistance and comparing performance of various modules.
Original languageEnglish
JournalReview of Scientific Instruments
Volume82
Issue number11
Number of pages3
ISSN0034-6748
DOIs
Publication statusPublished - 30 Nov 2011

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