@inproceedings{4abfeb5d98df456f82a0338b1769a439,
title = "Estimate on the uncertainty of predicting radiated emission from near-field scan caused by insufficient or inaccurate near-field data",
abstract = "Near-field scan on a Huygens{\textquoteright} box can be used in order to predict the maximal radiated emission from a Printed Circuit Board. The significance of step size and phase accuracy, and the importance of a full Huygens{\textquoteright} box are investigated by simulation of two different models with two different numerical methods. The prediction of maximal radiated emission is quite robust but the results also show that a full scan on all six surfaces is probably needed.",
author = "Morten S{\o}rensen and Andriy Radchenko and Keong Kam and Ondrej Franek and David Pommerenke and Pedersen, {Gert Fr{\o}lund}",
note = "Nominated for {"}best paper award{"}. 10 papers out of 292 accepted papers are nominated.; International Symposium on electromagnetic Compatibility : EMC Europe 2012, EMC Europe 2012 ; Conference date: 17-09-2012 Through 21-09-2012",
year = "2012",
doi = "10.1109/EMCEurope.2012.6396677",
language = "English",
isbn = "978-1-4673-0718-5",
series = "International Symposium on Electromagnetic Compatibility (EMC EUROPE) ",
pages = "1--6",
booktitle = "IEEE EMC Europe 2012",
publisher = "IEEE",
address = "United States",
}