Near-field imaging of out-of-plane light scattering in photonic crystal slabs

Valentyn Volkov; Sergey Bozhevolnyi; Dirk Taillaert

doi:10.1117/12.498756

Near-field imaging of out-of-plane light scattering in photonic crystal slabs

Valentyn Volkov, Sergey Bozhevolnyi, Dirk Taillaert

Research output: Contribution to journal › Conference article in Journal › Research › peer-review

Abstract

A collection scanning near-field optical microscope (SNOM) is used to image the propagating of light at telecommunication wavelengths (1520-1570 nm) along photonic crystal (PC) slabs, which combine slab waveguides with in-plane PCs consisting of one- and two-dimensional gratings. The efficient out-of-plane light scattering is directly observed for both 1D and 2D gratings (period 590 nm) fabricated on silicon-on-insulator wafers and the corresponding SNOM images are presented. Using the obtained SNOM images, we analyze light intensity distributions along PC gratings measured at different wavelengths and/or distances from the sample surface.

Original language	English
Book series	Proceedings of the Society of Photo-optical Instrumentation Engineers (SPIE)
Volume	5118
Pages (from-to)	541-548
Number of pages	8
ISSN	0277-786X
DOIs	https://doi.org/10.1117/12.498756
Publication status	Published - 2003

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title = "Near-field imaging of out-of-plane light scattering in photonic crystal slabs",

abstract = "A collection scanning near-field optical microscope (SNOM) is used to image the propagating of light at telecommunication wavelengths (1520-1570 nm) along photonic crystal (PC) slabs, which combine slab waveguides with in-plane PCs consisting of one- and two-dimensional gratings. The efficient out-of-plane light scattering is directly observed for both 1D and 2D gratings (period 590 nm) fabricated on silicon-on-insulator wafers and the corresponding SNOM images are presented. Using the obtained SNOM images, we analyze light intensity distributions along PC gratings measured at different wavelengths and/or distances from the sample surface.",

author = "Valentyn Volkov and Sergey Bozhevolnyi and Dirk Taillaert",

year = "2003",

doi = "10.1117/12.498756",

language = "English",

volume = "5118",

pages = "541--548",

journal = "Proceedings of the Society of Photo-optical Instrumentation Engineers (SPIE)",

issn = "0277-786X",

publisher = "Society of Photo-optical Instrumentation Engineers",

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TY - GEN

T1 - Near-field imaging of out-of-plane light scattering in photonic crystal slabs

AU - Volkov, Valentyn

AU - Bozhevolnyi, Sergey

AU - Taillaert, Dirk

PY - 2003

Y1 - 2003

N2 - A collection scanning near-field optical microscope (SNOM) is used to image the propagating of light at telecommunication wavelengths (1520-1570 nm) along photonic crystal (PC) slabs, which combine slab waveguides with in-plane PCs consisting of one- and two-dimensional gratings. The efficient out-of-plane light scattering is directly observed for both 1D and 2D gratings (period 590 nm) fabricated on silicon-on-insulator wafers and the corresponding SNOM images are presented. Using the obtained SNOM images, we analyze light intensity distributions along PC gratings measured at different wavelengths and/or distances from the sample surface.

AB - A collection scanning near-field optical microscope (SNOM) is used to image the propagating of light at telecommunication wavelengths (1520-1570 nm) along photonic crystal (PC) slabs, which combine slab waveguides with in-plane PCs consisting of one- and two-dimensional gratings. The efficient out-of-plane light scattering is directly observed for both 1D and 2D gratings (period 590 nm) fabricated on silicon-on-insulator wafers and the corresponding SNOM images are presented. Using the obtained SNOM images, we analyze light intensity distributions along PC gratings measured at different wavelengths and/or distances from the sample surface.

U2 - 10.1117/12.498756

DO - 10.1117/12.498756

M3 - Conference article in Journal

SN - 0277-786X

VL - 5118

SP - 541

EP - 548

JO - Proceedings of the Society of Photo-optical Instrumentation Engineers (SPIE)

JF - Proceedings of the Society of Photo-optical Instrumentation Engineers (SPIE)

ER -