Microelectronics Reliability: Editorial

Giovanni Busatto; Francesco Iannuzzo

doi:10.1016/j.microrel.2010.08.013

Microelectronics Reliability: Editorial

^*Corresponding author for this work

Research output: Contribution to journal › Editorial › peer-review

Original language	English
Journal	Microelectronics Reliability
Volume	50
Issue number	9-11
Pages (from-to)	1191-1192
Number of pages	2
ISSN	0026-2714
DOIs	https://doi.org/10.1016/j.microrel.2010.08.013
Publication status	Published - 1 Sept 2010
Externally published	Yes

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@article{aa28425921dc49fd9340bb22d5899bd3,

title = "Microelectronics Reliability: Editorial",

author = "Giovanni Busatto and Francesco Iannuzzo",

year = "2010",

month = sep,

day = "1",

doi = "10.1016/j.microrel.2010.08.013",

language = "English",

volume = "50",

pages = "1191--1192",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Pergamon Press",

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}

TY - JOUR

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T2 - Editorial

AU - Busatto, Giovanni

AU - Iannuzzo, Francesco

PY - 2010/9/1

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M3 - Editorial

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SN - 0026-2714

VL - 50

SP - 1191

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JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 9-11

ER -

Microelectronics Reliability: Editorial

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