Abstract
In single-phase inverters, DC-link capacitors are installed at the DC-link to buffer the ripple power between the AC side and DC side. Active decoupling methods introduce additional circuits at the DC side or AC side to partially or fully supply the ripple power. So that the demanded DC-link capacitor capacitance can be decreased. However, few research is about the effect of DC side and AC side decoupling on the DC-link capacitor reliability considering its electro-thermal stresses. This paper presents a quantitative analysis on the lifetime of capacitors with power decoupling circuits at the DC side and AC side, respectively. The ripple current spectrum of the capacitors is obtained by double Fourier analysis of a H-bridge inverter with natural sampling PWM modulation. A study case is demonstrated by a 2,000 W H-bridge inverter with 400 V DC-link voltage.
| Original language | English |
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| Title of host publication | Proceedings of the 42nd Annual Conference of the IEEE Industrial Electronics Society, IECON 2016 |
| Number of pages | 6 |
| Publisher | IEEE Press |
| Publication date | Oct 2016 |
| Pages | 6824-6829 |
| ISBN (Electronic) | 978-1-5090-3474-1 |
| DOIs | |
| Publication status | Published - Oct 2016 |
| Event | 42nd Conference of the Industrial Electronics Society, IECON 2016: 42nd Annual Conference of the IEEE Industrial Electronics Society - Palazzo dei Congressi, Florence, Italy Duration: 24 Oct 2016 → 27 Oct 2016 http://www.iecon2016.org/?jjj=1471434927195 http://www.iecon2016.org/ |
Conference
| Conference | 42nd Conference of the Industrial Electronics Society, IECON 2016 |
|---|---|
| Location | Palazzo dei Congressi |
| Country/Territory | Italy |
| City | Florence |
| Period | 24/10/2016 → 27/10/2016 |
| Sponsor | IEEE Industrial Electronics Society (IES), Institute of Electrical and Electronics Engineers (IEEE) |
| Internet address |