Configurational Resonances in Optical Near-Field Microscopy: A Rigorous Point-Dipole Approach

Ole Keller, Mufei Xiao, Sergei I. Bozhevolnyi

Research output: Contribution to journal › Journal article › Research › peer-review

Keywords

@article{d3eac2c0809211db8b97000ea68e967b,

title = "Configurational Resonances in Optical Near-Field Microscopy: A Rigorous Point-Dipole Approach",

keywords = "Scanning Near-field Optical Microscopy, Scanning Near-field Optical Microscopy",

author = "Ole Keller and Mufei Xiao and Bozhevolnyi, {Sergei I.}",

year = "1993",

language = "English",

volume = "280",

pages = "217--230",

journal = "Surface Science",

issn = "0039-6028",

publisher = "Elsevier",

}

TY - JOUR

T1 - Configurational Resonances in Optical Near-Field Microscopy

T2 - A Rigorous Point-Dipole Approach

AU - Keller, Ole

AU - Xiao, Mufei

AU - Bozhevolnyi, Sergei I.

PY - 1993

Y1 - 1993

KW - Scanning Near-field Optical Microscopy

M3 - Journal article

SN - 0039-6028

VL - 280

SP - 217

EP - 230

JO - Surface Science

JF - Surface Science

ER -