Original language | English |
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Journal | Microwave Journal |
Volume | 43 |
Issue number | 11 |
Pages (from-to) | 22-38 |
ISSN | 0192-6217 |
Publication status | Published - 2000 |
Improving Accuracy and Reliability of Microwave On-Wafer Silicon Device Measurements
T. E. Kolding
Research output: Contribution to journal › Journal article › Research › peer-review