Improving Accuracy and Reliability of Microwave On-Wafer Silicon Device Measurements

T. E. Kolding

Research output: Contribution to journalJournal articleResearchpeer-review

Original languageEnglish
JournalMicrowave Journal
Volume43
Issue number11
Pages (from-to)22-38
ISSN0192-6217
Publication statusPublished - 2000

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