Mapping of surface refractive-index distribution by reflection SNOM

Ilya Radko; Valentyn Volkov; Sergey Bozhevolnyi; J. Henningsen; J. Pedersen

Mapping of surface refractive-index distribution by reflection SNOM

Ilya Radko, Valentyn Volkov, Sergey Bozhevolnyi, J. Henningsen, J. Pedersen

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research

Original language	English
Title of host publication	Proceedings of SPIE, Optical Metrology 2005 : Vol. 5858: Nano- and Micro-Metrology
Editors	Heidi Ottevaere, Peter DeWolf, Diederik S. Wiersma
Publisher	SPIE - International Society for Optical Engineering
Publication date	2005
Pages	57-63
Publication status	Published - 2005
Event	SPIE, Optical Metrology 2005 - Munich, Germany Duration: 16 Jun 2005 → … Conference number: 5858

Conference

Conference	SPIE, Optical Metrology 2005
Number	5858
Country/Territory	Germany
City	Munich
Period	16/06/2005 → …

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Cite this

@inproceedings{edb7781068cd11dbb860000ea68e967b,

title = "Mapping of surface refractive-index distribution by reflection SNOM",

author = "Ilya Radko and Valentyn Volkov and Sergey Bozhevolnyi and J. Henningsen and J. Pedersen",

year = "2005",

language = "English",

pages = "57--63",

editor = "Heidi Ottevaere and Peter DeWolf and Wiersma, {Diederik S.}",

booktitle = "Proceedings of SPIE, Optical Metrology 2005",

publisher = "SPIE - International Society for Optical Engineering",

address = "United States",

note = "SPIE, Optical Metrology 2005 ; Conference date: 16-06-2005",

}

Radko, I, Volkov, V, Bozhevolnyi, S, Henningsen, J & Pedersen, J 2005, Mapping of surface refractive-index distribution by reflection SNOM. in H Ottevaere, P DeWolf & DS Wiersma (eds), Proceedings of SPIE, Optical Metrology 2005: Vol. 5858: Nano- and Micro-Metrology. SPIE - International Society for Optical Engineering, pp. 57-63, SPIE, Optical Metrology 2005, Munich, Germany, 16/06/2005.

Mapping of surface refractive-index distribution by reflection SNOM. / Radko, Ilya; Volkov, Valentyn; Bozhevolnyi, Sergey et al.
Proceedings of SPIE, Optical Metrology 2005: Vol. 5858: Nano- and Micro-Metrology. ed. / Heidi Ottevaere; Peter DeWolf; Diederik S. Wiersma. SPIE - International Society for Optical Engineering, 2005. p. 57-63.

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research

TY - GEN

T1 - Mapping of surface refractive-index distribution by reflection SNOM

AU - Radko, Ilya

AU - Volkov, Valentyn

AU - Bozhevolnyi, Sergey

AU - Henningsen, J.

AU - Pedersen, J.

N1 - Conference code: 5858

PY - 2005

Y1 - 2005

M3 - Article in proceeding

SP - 57

EP - 63

BT - Proceedings of SPIE, Optical Metrology 2005

A2 - Ottevaere, Heidi

A2 - DeWolf, Peter

A2 - Wiersma, Diederik S.

PB - SPIE - International Society for Optical Engineering

T2 - SPIE, Optical Metrology 2005

Y2 - 16 June 2005

ER -