Abstract
We report a novel approach for metal organic vapor phase epitaxy of (Al)GaN heterostructures on Si substrates. An approximately 90–100 nm thick SiC buffer layer is synthesized using the reaction between Si substrate and CO gas. Highresolution transmission electron microscopy reveals sharp crystalline interfaces with epitaxial relationship between SiC/Si and AlN/SiC layers. Optimization of SiC morphology and AlN seed layer thickness facilitates the growth of GaN layers free of pits (v-defects). It is also found that Si doping
eliminates these defects in the case of growth on SiC templates with non-optimized surface morphology. Thus, synthesis of thin SiC buffer layer is suggested as a solution for the interface problems at the initial stage of III-N on Si epitaxy.
eliminates these defects in the case of growth on SiC templates with non-optimized surface morphology. Thus, synthesis of thin SiC buffer layer is suggested as a solution for the interface problems at the initial stage of III-N on Si epitaxy.
Original language | English |
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Article number | 1700190 |
Journal | Physica Status Solidi. A: Applications and Materials Science |
Volume | 214 |
Issue number | 10 |
Number of pages | 7 |
ISSN | 0031-8965 |
DOIs | |
Publication status | Published - Jul 2017 |
Keywords
- epitaxy, topochemical, Gallium Nitride