Novel field test design for acquisition of DC and AC parameters during service

Sune Thorsteinsson, Peter Poulsen, Jørgen Schou, Anders Rand Andersen, Ronni Basu, Dezso Sera, Sergiu Spataru, Matei-lon Oprea

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

Abstract

Being able to monitor early signs of PV module degradation, is needed to ensure stable power production throughout the service life of a PV installation. Recently, impedance spectroscopy is proven to be a useful tool for detection of the presence and location of significant errors, and may have potential for more. In this work we describe a field test design where the modules are operating at their maximum power point, and via relays is switched out one by one for acquisition of an IV curve and an impedance spectrum. Some of the modules involved will undergo stimuli to accelerate certain degradation mechanisms, and fitting parameters extracted from the field test will be correlated with irradiance and compared to similar parameters of virgin modules of same kind, and conventional laboratory measurements on the same modules. The proposed method will provide data for exploration of early degradation signs using impedance measurements.
Original languageEnglish
Title of host publicationProceedings of 43rd IEEE Photovoltaic Specialists Conference (PVSC), 2016
Number of pages3
PublisherIEEE Press
Publication dateJun 2016
Pages1608-1610
ISBN (Electronic)978-1-5090-2724-8
DOIs
Publication statusPublished - Jun 2016
Event43rd IEEE Photovoltaic Specialist Conference - Portland, United States
Duration: 5 Jun 201610 Jun 2016
http://www.ieee-pvsc.org/PVSC43/

Conference

Conference43rd IEEE Photovoltaic Specialist Conference
Country/TerritoryUnited States
CityPortland
Period05/06/201610/06/2016
Internet address

Keywords

  • Impedance
  • Degradation
  • Impedance measurement
  • Temperature measurement
  • Circuit faults
  • Current measurement
  • Monitoring

Fingerprint

Dive into the research topics of 'Novel field test design for acquisition of DC and AC parameters during service'. Together they form a unique fingerprint.

Cite this