Prediction of bond wire fatigue of IGBTs in a PV inverter under long-term operation

Paula Diaz Reigosa, Huai Wang, Yongheng Yang, Frede Blaabjerg

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

21 Citations (Scopus)
944 Downloads (Pure)

Abstract

Bond wire fatigue is one of the dominant failure mechanisms in IGBT modules. However, the bond wire lifetime is not easily predictable and measurable to date due to several challenges. To overcome this challenge, this paper proposes a Monte Carlo based analysis method to predict the lifetime consumption of bond wires in a Photovoltaic (PV) inverter under long-term operation. The parameter distributions of IGBTs due to manufacturing variation and the annual stress profiles due to intermittent nature of solar irradiance and ambient temperature are taken into consideration. The proposed method enables a more realistic lifetime prediction with a specified confidence level compared to the state-of-the-art approaches. A study case on IGBT modules in a 10 kW three-phase PV inverter demonstrates the procedure and the results of the analysis. Finally, the lifetime distribution of bond wires permits to estimate the risk of unreliability of a single IGBT in a Photovoltaic (PV) inverter.
Original languageEnglish
Title of host publicationProceedings of the 2015 IEEE Applied Power Electronics Conference and Exposition (APEC)
Number of pages8
PublisherIEEE Press
Publication dateMar 2015
Pages3052-3059
ISBN (Print)978-1-4799-6735-3
DOIs
Publication statusPublished - Mar 2015
Event30th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2015 - Charlotte, United States
Duration: 15 Mar 201519 Mar 2015

Conference

Conference30th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2015
Country/TerritoryUnited States
CityCharlotte
Period15/03/201519/03/2015
SeriesI E E E Applied Power Electronics Conference and Exposition. Conference Proceedings
ISSN1048-2334

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