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Abstract
In this paper, the thermal stress on bond wires of aged IGBT modules under short-circuit conditions has been studied with respect to different solder delamination levels. To ensure repeatable test conditions, ad-hoc DBC (direct bond copper) samples with delaminated solder layers have been purposely fabricated. The temperature distribution produced by such abnormal conditions has been modelled first by means of FEM simulations and then experimentally validated by means of a non-destructive testing technique including an ultra-fast infrared camera. Results demonstrate a significant imbalance in the surface temperature distribution which confirms the hypothesis that short-circuit events produce significantly uneven stresses on bond wires.
Original language | English |
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Title of host publication | Proceedings of IEEE Energy Conversion Congress and Exposition (ECCE), 2016 |
Number of pages | 7 |
Publisher | IEEE Press |
Publication date | Sept 2016 |
ISBN (Electronic) | 978-1-5090-0737-0 |
DOIs | |
Publication status | Published - Sept 2016 |
Event | 8th Annual IEEE Energy Conversion Congress & Exposition: ECCE 2016 - Milwaukee, WI, United States Duration: 18 Sept 2016 → 22 Sept 2016 http://www.ieee-ecce.org/ |
Conference
Conference | 8th Annual IEEE Energy Conversion Congress & Exposition |
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Country/Territory | United States |
City | Milwaukee, WI |
Period | 18/09/2016 → 22/09/2016 |
Sponsor | IEEE, IEEE Industry Applications Society (IAS), IEEE Power Electronics and Industry Applications Societies (PELS) |
Internet address |
Keywords
- Electro-thermal models
- Insulated gate bipolar transistor (IGBT)
- Reliability
- Short-circuit
- Solder fatigue
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Dive into the research topics of 'Prediction of Short-Circuit-Related Thermal Stress in Aged IGBT Modules'. Together they form a unique fingerprint.Projects
- 1 Finished
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Center Of Reliable Power Electronics (CORPE)
Blaabjerg, F., Munk-Nielsen, S., Pedersen, K. & Popok, V.
01/04/2011 → 31/12/2016
Project: Research