Reliability Analysis of Micro-Inverters Considering PV Module Variations and Degradation Rates

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Abstract

This paper analyzes the impact of PV module variations on the micro-inverter reliability. The evaluation results show a significant deviation in the micro-inverter reliability for different PV modules. Moreover, the PV module degradation impacts are also taken into consideration in the reliability assessment. Such information can be used to reduce the cost of the final designed micro-inverter and better match the PV application.
Original languageEnglish
Title of host publicationProceedings of 2018 20th European Conference on Power Electronics and Applications (EPE'18 ECCE Europe)
Number of pages8
PublisherIEEE Press
Publication dateSept 2018
Pages1-8
Article number8515325
ISBN (Print)978-1-5386-4145-3
ISBN (Electronic)978-9-0758-1528-3
Publication statusPublished - Sept 2018
Event20th European Conference on Power Electronics and Applications (EPE'18 ECCE Europe) - Riga, Latvia
Duration: 17 Sept 201821 Sept 2018

Conference

Conference20th European Conference on Power Electronics and Applications (EPE'18 ECCE Europe)
Country/TerritoryLatvia
CityRiga
Period17/09/201821/09/2018

Keywords

  • Mission profile
  • Photovoltaic
  • Power semiconductor device
  • Reliability
  • Thermal stress

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