POWER CYCLING TEST DATASET (GEOL: A GRADIENT-BASED END-OF-LIFE CRITERION FOR POWER SEMICONDUCTOR MODULES)

The dataset includes on-state saturation voltage information for eight samples under four different test conditions. Each Excel file consists of two data columns: one for cycle numbers and the other for on-state saturation voltage. Although these data were collected during the power cycling test at the maximum junction temperature, the effect of temperature increase in the on-state voltage has been compensated. Namely, the provided on-state voltage has been unified to the corresponding to the respective 125°C or 150°C. More data details can be found in the article: Y. Zhang, Y. Zhang, and H. Wang, “gEOL: A Gradient-based end-of-Life criterion for power semiconductor modules,” IEEE Trans.Power Electron.