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  • 2021

    Sewer-ML: A Multi-Label Sewer Defect Classification Dataset and Benchmark

    Haurum, J. B. & Moeslund, T. B., 2021, (Accepteret/In press) 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR). 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR): IEEE, 12 s. (I E E E Conference on Computer Vision and Pattern Recognition. Proceedings).

    Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

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