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Publikationer 1989 2020

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Konferenceartikel i tidsskrift
2019

A mission profile-based reliability analysis framework for photovoltaic DC-DC converters

Van De Sande, W., Ravyts, S., Sangwongwanich, A., Manganiello, P., Yang, Y., Blaabjerg, F., Driesen, J. & Daenen, M., sep. 2019, I : Microelectronics Reliability. 100-101, 5 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

reliability analysis
DC-DC converters
Reliability analysis
converters
direct current

Drone-Based Daylight Electroluminescence Imaging of PV Modules

Alves dos Reis Benatto, G., Mantel, C., Spataru, S. V., A. Santamaria Lancia, A., Riedel, N., Thorsteinsson, S., Poulsen, P., Parikh, H. R., Forchhammer, S. & Séra, D., 2019, (Accepteret/In press) I : I E E E Journal of Photovoltaics.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Electroluminescence
electroluminescence
modules
Imaging techniques
irradiance
1 Downloads (Pure)

Implications of short-circuit events on power cycling of 1.2-kV/20-A SiC MOSFET power modules

Du, H., Ceccarelli, L., Iannuzzo, F. & Reigosa, P. D., sep. 2019, I : Microelectronics Reliability. 100-101, s. 1-6 6 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Åben adgang
Fil
short circuits
Short circuit currents
field effect transistors
cycles
degradation
2018
105 Downloads (Pure)

A multi-port thermal coupling model for multi-chip power modules suitable for circuit simulators

Wang, Z., Wang, H., Zhang, Y. & Blaabjerg, F., sep. 2018, I : Microelectronics Reliability. 88-90, s. 519-523 5 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Fil
simulators
Simulators
chips
Networks (circuits)
curve fitting

An empirical model for thermal interface materials based on experimental characterizations under realistic conditions

Zhang, Y., Wang, H., Wang, Z. & Blaabjerg, F., sep. 2018, I : Microelectronics Reliability. 88-90, s. 806-811 6 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

screws
thermal resistance
converters
torque
platforms
3 Citationer (Scopus)

A Review of Different Electric Equivalent Circuit Models and Parameter Identification Methods of Lithium-Ion Batteries

Madani, S. S., Schaltz, E. & Kær, S. K., aug. 2018, I : ECS Transactions. 87, 1, s. 23-37 15 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Equivalent circuits
Identification (control systems)
Lithium-ion batteries
Electric vehicles
Electrochemical impedance spectroscopy
4 Citationer (Scopus)

Comparison of lithium-ion battery performance at beginning-of-life and end-of-life

Stroe, A-I., Knap, V. & Stroe, D-I., sep. 2018, I : Microelectronics Reliability. 88-90, s. 1251-1255 5 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

electric batteries
lithium
Aging of materials
Open circuit voltage
ions
1 Citation (Scopus)

Converter monitoring in a wind turbine application

Rannestad, B., Nielsen, P., Munk-Nielsen, S., Gadgaard, K. & Jørgensen, S., 1 sep. 2018, I : Microelectronics Reliability. 88-90, s. 1008-1013 6 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

wind turbines
Wind turbines
converters
Semiconductor materials
Monitoring
4 Citationer (Scopus)
8 Downloads (Pure)

Effect of short-circuit stress on the degradation of the SiO2 dielectric in SiC power MOSFETs

Reigosa, P. D., Iannuzzo, F. & Ceccarelli, L., sep. 2018, I : Microelectronics Reliability. 88-90, s. 577-583 7 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

short circuits
Leakage currents
Short circuit currents
field effect transistors
degradation
100 Downloads (Pure)

Experimental Study on Calendaristic Degradation and Self-Discharge of 3.4 Ah Lithium-Sulfur Pouch Cells

Knap, V. & Stroe, D-I., 2018, I : ECS Transactions. 85, 13, s. 267-273 7 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Åben adgang
Fil
Lithium
Sulfur
Degradation
Monitoring
Costs
1 Citation (Scopus)
10 Downloads (Pure)

Failure mechanism analysis of fuses subjected to manufacturing and operational thermal stresses

Bahman, A. S., Jensen, S. M. & Iannuzzo, F., sep. 2018, I : Microelectronics Reliability. 88-90, s. 304-308 5 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

fuses
Electric fuses
thermal stresses
Thermal stress
manufacturing
1 Citation (Scopus)

Failure protection in power modules with auxiliary-emitter bondwires

Baker, N. & Iannuzzo, F., jan. 2018, I : PCIM Europe Conference Proceedings. 225809, s. 1051-1056 6 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Resistors
Explosions
Sensors

Frequency domain scanning acoustic microscopy for power electronics: Physics-based feature identification and selectivity

Uhrenfeldt, C., Munk-Nielsen, S. & Beczkowski, S., 1 sep. 2018, I : Microelectronics Reliability. 88-90, s. 726-732 7 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Power electronics
Physics
selectivity
microscopy
Imaging techniques
8 Citationer (Scopus)

Hotspots and performance evaluation of crystalline-silicon and thin-film photovoltaic modules

Ahsan, S., Niazi, K. A. K., Khan, H. A. & Yang, Y., sep. 2018, I : Microelectronics Reliability. 88-90, s. 1014-1018 5 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

copper indium selenides
Indium
Silicon
silicon films
Copper
1 Citation (Scopus)

Impact of meteorological variations on the lifetime of grid-connected PV inverters

Brito, E. M. S., Cupertino, A. F., Reigosa, P. D., Yang, Y., Mendes, V. F. & Pereira, H. A., sep. 2018, I : Microelectronics Reliability. 88-90, s. 1019-1024 6 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

inverters
grids
life (durability)
irradiance
Palmgren-Miner rule
14 Downloads (Pure)

Investigating SiC MOSFET body diode's light emission as temperature-sensitive electrical parameter

Ceccarelli, L., Luo, H. & Iannuzzo, F., sep. 2018, I : Microelectronics Reliability. 88-90, s. 627-630 4 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Light emission
light emission
Diodes
field effect transistors
diodes
1 Citation (Scopus)
26 Downloads (Pure)

Investigation of acoustic emission as a non-invasive method for detection of power semiconductor aging

Davari, P., Kristensen, O. D. & Iannuzzo, F., sep. 2018, I : Microelectronics Reliability. 88-90, s. 545-549 5 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

acoustic emission
Acoustic emissions
Aging of materials
Semiconductor materials
Condition monitoring
2 Citationer (Scopus)
20 Downloads (Pure)

Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules

Du, H., Reigosa, P. D., Iannuzzo, F. & Ceccarelli, L., 1 sep. 2018, I : Microelectronics Reliability. 88-90, s. 661-665 5 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

short circuits
Short circuit currents
field effect transistors
static characteristics
degradation
1 Citation (Scopus)

Lifetime prediction of aluminum electrolytic capacitors in LED drivers considering parameter shifts

Niu, H., Wang, S., Ye, X., Wang, H. & Blaabjerg, F., sep. 2018, I : Microelectronics Reliability. 88-90, s. 453-457 5 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Electrolytic capacitors
Aluminum
Light emitting diodes
capacitors
caps
3 Citationer (Scopus)

Lithium-ion battery state of health estimation with short-term current pulse test and support vector machine

Meng, J., Cai, L., Luo, G., Stroe, D-I. & Teodorescu, R., sep. 2018, I : Microelectronics Reliability. 88-90, s. 1216-1220 5 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

health
Support vector machines
electric batteries
lithium
Health
3 Citationer (Scopus)

Mission profile resolution impacts on the thermal stress and reliability of power devices in PV inverters

Sangwongwanich, A., Zhou, D., Liivik, E. & Blaabjerg, F., sep. 2018, I : Microelectronics Reliability. 88-90, s. 1003-1007 5 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

inverters
thermal stresses
Thermal stress
profiles
predictions
3 Citationer (Scopus)
10 Downloads (Pure)

On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition

Luo, H., Reigosa, P. D., Iannuzzo, F. & Blaabjerg, F., sep. 2018, I : Microelectronics Reliability. 88-90, s. 563-567 5 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

solders
Soldering alloys
field effect transistors
modules
degradation
10 Downloads (Pure)

Power cycling test of transfer molded IGBT modules by advanced power cycler under different junction temperature swings

Choi, U. M., Jørgensen, S., Iannuzzo, F. & Blaabjerg, F., sep. 2018, I : Microelectronics Reliability. 88-90, s. 788-794 7 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Insulated gate bipolar transistors (IGBT)
modules
cycles
Power electronics
Temperature

Reliability assessment of power conditioner considering maintenance in a PEM fuel cell system

Bahrebar, S., Zhou, D., Rastayesh, S., Wang, H. & Blaabjerg, F., sep. 2018, I : Microelectronics Reliability. 88-90, s. 1177-1182 6 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

fuel cells
maintenance
Fuel cells
availability
failure modes
9 Downloads (Pure)

Simple and effective open switch fault diagnosis of single-phase PWM rectifier

Hu, K., Liu, Z., Iannuzzo, F. & Blaabjerg, F., sep. 2018, I : Microelectronics Reliability. 88-90, s. 423-427 5 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

pulse duration modulation
rectifiers
Pulse width modulation
Failure analysis
switches
1 Citation (Scopus)
10 Downloads (Pure)

Smart SiC MOSFET accelerated lifetime testing

Baker, N. & Iannuzzo, F., sep. 2018, I : Microelectronics Reliability. 88-90, s. 43-47 5 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

field effect transistors
Semiconductor materials
life (durability)
Monitoring
Testing
2 Citationer (Scopus)
142 Downloads (Pure)

State-of-Health Estimation of Lithium-Ion Batteries based on Partial Charging Voltage Profiles

Stroe, D-I., Knap, V. & Schaltz, E., 2018, I : ECS Transactions. 85, 13, s. 379-386 8 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Åben adgang
Fil
Health
Electric potential
Aging of materials
Lithium-ion batteries
2 Citationer (Scopus)
10 Downloads (Pure)

Thermal modeling of wire-bonded power modules considering non-uniform temperature and electric current interactions

Akbari, M., Bahman, A. S., Reigosa, P. D., Iannuzzo, F. & Tavakoli Bina, M., sep. 2018, I : Microelectronics Reliability. 88-90, s. 1135-1140 6 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Electric currents
electric current
Insulated gate bipolar transistors (IGBT)
wire
Wire
22 Downloads (Pure)

Thermal resistance modelling and design optimization of PCB vias

Shen, Y., Wang, H. & Blaabjerg, F., sep. 2018, I : Microelectronics Reliability. 88-90, s. 1118-1123 6 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

design optimization
printed circuits
circuit boards
thermal resistance
Heat resistance

Thermal stress reduction of quasi-Z source inverter drive by model predictive control

Liu, P., Wang, H., Liu, Y. & Blaabjerg, F., sep. 2018, I : Microelectronics Reliability. 88-90, s. 1247-1250 4 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Model predictive control
thermal stresses
Thermal stress
Power electronics
Cost functions
1 Citation (Scopus)
18 Downloads (Pure)

Uncertainty analysis of capacitor reliability prediction due to uneven thermal loading in photovoltaic applications

Vernica, I., Wang, H. & Blaabjerg, F., sep. 2018, I : Microelectronics Reliability. 88-90, s. 1036-1041 6 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Uncertainty analysis
capacitors
Capacitors
predictions
direct current
74 Downloads (Pure)

Utilisation of symmetrical components in a communication-based protection for loop MV feeders with variable short-circuit power

Ciontea, C-I., Bak, C. L., Blaabjerg, F., Hong, Q., Booth, C. & Madsen, K. K., okt. 2018, I : The Journal of Engineering. 2018, 15, s. 1245-1251 7 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Åben adgang
Fil
Short circuit currents
Communication
Electric potential
Relay protection
Circuit theory
2017
2 Citationer (Scopus)
74 Downloads (Pure)

A Coordinated LVRT Control for a PMSG Wind Turbine

Kim, C., Gui, Y. & Chung, C. C., jul. 2017, I : IFAC-PapersOnLine. 50, 1, s. 8758-8763 6 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Åben adgang
Fil
Wind turbines
Rotors
Electric potential
Synchronous generators
Transient analysis
4 Citationer (Scopus)

Advanced power cycler with intelligent monitoring strategy of IGBT module under test

Choi, U. M., Blaabjerg, F. & Iannuzzo, F., sep. 2017, I : Microelectronics Reliability. 76-77, s. 522-526 5 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Insulated gate bipolar transistors (IGBT)
modules
Wear of materials
Monitoring
cycles
16 Citationer (Scopus)
16 Downloads (Pure)

A survey of SiC power MOSFETs short-circuit robustness and failure mode analysis

Ceccarelli, L., Reigosa, P. D., Iannuzzo, F. & Blaabjerg, F., sep. 2017, I : Microelectronics Reliability. 76-77, s. 272-276 5 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Åben adgang
Fil
failure modes
short circuits
Short circuit currents
Failure modes
field effect transistors
1 Citation (Scopus)
41 Downloads (Pure)

Capacitive effects in IGBTs limiting their reliability under short circuit

Reigosa, P. D., Iannuzzo, F., Rahimo, M. & Blaabjerg, F., 2017, I : Microelectronics Reliability. 76-77, s. 485-489 5 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Åben adgang
Fil
Insulated gate bipolar transistors (IGBT)
short circuits
Short circuit currents
oscillations
Circuit oscillations
5 Citationer (Scopus)

Converter-level FEM simulation for lifetime prediction of an LED driver with improved thermal modelling

Niu, H., Wang, H., Ye, X., Wang, S. & Blaabjerg, F., sep. 2017, I : Microelectronics Reliability. 76-77, s. 117-122 6 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

ambient temperature
converters
Light emitting diodes
light emitting diodes
life (durability)

Cooling Simulation and Thermal Abuse Modeling of Lithium-Ion Batteries Using the Newman, Tiedemann, Gu, and Kim (NTGK) Model

Saeed Madani, S., Swierczynski, M. J. & Kær, S. K., 2017, I : ECS Transactions. 81, 1, s. 261-270 10 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Cooling
Temperature
Heat transfer coefficients
Energy utilization
Lithium-ion batteries
210 Downloads (Pure)

Demand Side Management Using the Internet of Energy Based on LoRaWAN Technology

Shahryari, K., Anvari-Moghaddam, A. & Shahryari, S., aug. 2017, I : Kurdistan Journal of Applied Research - KJAR. 2, 3, s. 112-119 8 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Åben adgang
Fil
Internet
Fog
Data communication systems
Wireless telecommunication systems
Gateways (computer networks)
10 Citationer (Scopus)

Die degradation effect on aging rate in accelerated cycling tests of SiC power MOSFET modules

Luo, H., Baker, N., Iannuzzo, F. & Blaabjerg, F., sep. 2017, I : Microelectronics Reliability. 76-77, s. 415-419 5 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

field effect transistors
modules
Aging of materials
degradation
Degradation
1 Citation (Scopus)

Evolution of Surface Temperature of a 13 Amp Hour Nano Lithium-Titanate Battery Cell under Fast Charging

Saeed Madani, S., Swierczynski, M. J. & Kær, S. K., 2017, I : ECS Transactions. 81, 1, s. 271-279

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Lithium
Hybrid vehicles
Thermocouples
Electric vehicles
Temperature
2 Citationer (Scopus)
Gallium nitride
gallium nitrides
High electron mobility transistors
Silicon
high electron mobility transistors
5 Citationer (Scopus)

Fundamental-frequency and load-varying thermal cycles effects on lifetime estimation of DFIG power converter

Zhang, G., Zhou, D., Yang, J. & Blaabjerg, F., sep. 2017, I : Microelectronics Reliability. 76-77, s. 549-555 7 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

power converters
Asynchronous generators
Power converters
induction
generators

Incremental Capacity Analysis of a Lithium-Ion Battery Pack for Different Charging Rates

Kalogiannis, T., Stroe, D-I., Nyborg, J., Nørregaard, K., Christensen, A. E. & Schaltz, E., 2017, I : ECS Transactions. 77, 11, s. 403-412 10 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Ions
Electrochemical properties
Lithium
Health
Electric potential
192 Downloads (Pure)

Maximum Energy Yield Oriented Turbine Control in PMSG based Wind Farm

Tian, J., Zhou, D., Su, C., Blaabjerg, F. & Chen, Z., 2017, I : The Journal of Engineering. 2017, 13, s. 2455-2460 6 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Åben adgang
Fil
Synchronous generators
Wind turbines
Permanent magnets
Turbines
Offshore wind farms
3 Citationer (Scopus)
130 Downloads (Pure)

Methodology for Assessing the Lithium-Sulfur Battery Degradation for Practical Applications

Knap, V., Stroe, D-I., Purkayastha, R., Walus, S., Auger, D. J., Fotouhi, A. & Propp, K., 2017, I : ECS Transactions. 77, 11, s. 479-490 12 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Åben adgang
Fil
Degradation
Standardization
Lithium sulfur batteries
Testing
Costs
5 Citationer (Scopus)
63 Downloads (Pure)

Plug-and-play control and consensus algorithms for current sharing in DC microgrids

Tucci, M., Meng, L., Guerrero, J. M. & Ferrari-Trecate, G., jul. 2017, I : IFAC-PapersOnLine. 50, 1, s. 12440-12445 6 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

Åben adgang
Fil
Distributed power generation
Electric potential
Transfer functions
Stabilization
Controllers
2 Citationer (Scopus)
19 Downloads (Pure)

Reliability assessment platform for the power semiconductor devices - Study case on 3-phase grid-connected inverter application

Vernica, I., Ma, K. & Blaabjerg, F., sep. 2017, I : Microelectronics Reliability. 76-77, s. 31-37 7 s.

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Åben adgang
Fil
semiconductor devices
platforms
grids
software development tools
GTP Pyrophosphokinase
4 Citationer (Scopus)

Reliability-oriented environmental thermal stress analysis of fuses in power electronics

Bahman, A. S., Iannuzzo, F., Holmgaard, T., Nielsen, R. Ø. & Blaabjerg, F., sep. 2017, I : Microelectronics Reliability. 76-77, s. 25-30 6 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

fuses
stress analysis
Electric fuses
thermal stresses
Power electronics
75 Downloads (Pure)

Renewable energies: modeling and optimization of production cost

El Kafazi, I., Bannari, R., Adiba, E. B. E. I., Nabil, H. & Dragicevic, T., okt. 2017, I : Energy Procedia. 136, s. 380-387 8 s.

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Åben adgang
Fil
Costs
Scheduling