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POWER CYCLING TEST DATASET (GEOL: A GRADIENT-BASED END-OF-LIFE CRITERION FOR POWER SEMICONDUCTOR MODULES)
Zhang, Y. (Bidrager), Zhang, Y. (Ophavsperson) & Wang, H. (Bidrager), IEEE DataPort, 1 dec. 2023
DOI: 10.21227/ksrt-zq09, https://ieee-dataport.org/documents/power-cycling-test-dataset-geol-gradient-based-end-life-criterion-power-semiconductor
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CMT#10-3 IGBT power cycling data
Zhang, Y. (Ophavsperson), IEEE DataPort, 2021
DOI: 10.21227/zx0k-ky08, https://ieee-dataport.org/open-access/cmt10-3-igbt-power-cycling-data
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