• Pontoppidanstræde 111, 1168

    9220 Aalborg Ø

    Danmark

20152021
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Teknik og materialevidenskab

Gallium nitride
Silicon carbide
Short circuit currents
Insulated gate bipolar transistors (IGBT)
Electric potential
Soldering alloys
Thermal stress
High electron mobility transistors
Inductance
Heat sinks
Packaging
Networks (circuits)
Wire
Electron tubes
Delamination
Topology
Capacitance
Failure analysis
Transistors
Temperature distribution
Finite element method
Leakage currents
Silicon
Acoustic microscopes
Busbars
Copper
Energy gap
Degradation
Power electronics
Power converters
Thermal cycling
Scanning
Nondestructive examination
Aluminum
Printed circuit boards
Temperature
Signal interference
Natural frequencies
Diodes
Capacitors
Physics
Switching frequency
Cameras
Infrared radiation
Substrates
Imaging techniques
Heating
Frequency domain analysis
Semiconductor materials
Power MOSFET

Fysik og astronomi

General

failure analysis
leakage
selectivity
microscopy
augmentation
thin films
electronics
frequency domain analysis
nondestructive tests
structural analysis
imaging techniques
causes

Physics

cycles
nanoparticles
physics
acoustics
echoes
temperature

Chemistry and Materials

gallium nitrides
silicon

Engineering

high electron mobility transistors
solar cells
trapping
scanning
broadband
modules
packaging
thermal stresses

Aeronautics

photocurrents