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20152021
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Publikationer 2015 2019

  • 17 Konferenceartikel i proceeding
  • 8 Tidsskriftartikel
  • 2 Konferenceartikel i tidsskrift
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Tidsskriftartikel
2019
45 Downloads (Pure)

A Fast-Switching Integrated Full-Bridge Power Module Based on GaN eHEMT Devices

Jørgensen, A. B., Beczkowski, S., Uhrenfeldt, C., Høgholt Petersen, N., Jørgensen, S. & Munk-Nielsen, S., mar. 2019, I : IEEE Transactions on Power Electronics. 34, 3, s. 2494-2504 11 s., 8375808.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

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Gallium nitride
Packaging
SPICE
High electron mobility transistors
Semiconductor devices
5 Downloads (Pure)
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Silicon carbide
Natural frequencies
Electric potential
Electron tubes
Dielectric heating
13 Downloads (Pure)
Fil
Capacitance
Electric potential
Energy dissipation
Power electronics
Packaging
2017
5 Citationer (Scopus)
324 Downloads (Pure)

Modeling of Short-Circuit-Related Thermal Stress in Aged IGBT Modules

Bahman, A. S., Iannuzzo, F., Uhrenfeldt, C., Blaabjerg, F. & Munk-Nielsen, S., sep. 2017, I : I E E E Transactions on Industry Applications. 53, 5, s. 4788 - 4795 8 s.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

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Insulated gate bipolar transistors (IGBT)
Thermal stress
Short circuit currents
Soldering alloys
Temperature distribution
15 Citationer (Scopus)

Short-Circuit Degradation of 10-kV 10-A SiC MOSFET

Eni, E-P., Beczkowski, S., Munk-Nielsen, S., Kerekes, T., Teodorescu, R., Juluri, R. R., Julsgaard, B., VanBrunt, E., Hull, B., Sabri, S., Grider, D. & Uhrenfeldt, C., dec. 2017, I : I E E E Transactions on Power Electronics. 32, 12, s. 9342 - 9354 13 s.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

Short circuit currents
Degradation
Aluminum
Melting point
Electron microscopes
2016
61 Citationer (Scopus)
1383 Downloads (Pure)

Influences of Device and Circuit Mismatches on Paralleling Silicon Carbide MOSFETs

Li, H., Munk-Nielsen, S., Wang, X., Maheshwari, R. K., Beczkowski, S., Uhrenfeldt, C. & Franke, T., jan. 2016, I : I E E E Transactions on Power Electronics. 31, 1, s. 621 - 634 14 s.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

Fil
Silicon carbide
Networks (circuits)
Inductance
22 Citationer (Scopus)

Power cycling test and failure analysis of molded Intelligent Power IGBT Module under different temperature swing durations

Choi, U., Blaabjerg, F., Jørgensen, S., Iannuzzo, F., Wang, H., Uhrenfeldt, C. & Munk-Nielsen, S., sep. 2016, I : Microelectronics Reliability. 64, s. 403-408 6 s.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

failure analysis
Insulated gate bipolar transistors (IGBT)
Failure analysis
cycles
modules
2015
10 Citationer (Scopus)

Broadband photocurrent enhancement and light-trapping in thin film Si solar cells with periodic Al nanoparticle arrays on the front

Uhrenfeldt, C., Villesen, T. F., Tetu, A., Johansen, B. & Larsen, A. N., 1 jun. 2015, I : Optics Express. 23, 11, s. A525-A538 14 s.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

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photocurrents
solar cells
trapping
broadband
nanoparticles