Projekter pr. år
Fingerprint
- 1 Lignende profiler
Netværk
Projekter
- 3 Afsluttet
-
Statistics-Based Layout Design Tool for Paralleled Semiconductors (STABLE)
Uhrenfeldt, C., Baker, N., Beczkowski, S. M., Rasmussen, J. G. & Steffensen, B.
ECPE Engineering Center for Power Electronics GmbH
01/08/2020 → 31/01/2022
Projekter: Projekt › Forskning
-
Thin-Film Sensors for High Reliability Semiconductors
01/09/2019 → 31/03/2021
Projekter: Projekt › Forskning
-
Condition Monitoring Sensor for Extended Power Module Lifetime and Catastrophic Failure Prevention
Baker, N. & Maarbjerg, M. N.
ECPE Engineering Center for Power Electronics GmbH
01/09/2018 → 31/08/2019
Projekter: Projekt › Forskning
Publikationer
-
Effect of short-circuit degradation on the remaining useful lifetime of SiC MOSFETs and its failure analysis
Du, H., Letz, S., Baker, N., Goetz, T., Iannuzzo, F. & Schletz, A., nov. 2020, I: Microelectronics Reliability. 114, s. 1-5 5 s., 113784.Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review
2 Citationer (Scopus) -
Implications of Short-Circuit Degradation on the Aging Process in Accelerated Cycling Tests of SiC MOSFETs
Du, H., Baker, N. & Iannuzzo, F., aug. 2020, 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD). IEEE, s. 202-205 4 s. 9170133. (Proceedings of the International Symposium on Power Semiconductor Devices and ICs).Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review
Åben adgangFil1 Citationer (Scopus)12 Downloads (Pure) -
Study of Current Density Influence on Bond Wire Degradation Rate in SiC MOSFET Modules
Luo, H., Iannuzzo, F., Baker, N., Blaabjerg, F., Li, W. & He, X., jun. 2020, I: IEEE Journal of Emerging and Selected Topics in Power Electronics. 8, 2, s. 1622-1632 11 s., 8730380.Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review
Åben adgangFil11 Citationer (Scopus)359 Downloads (Pure) -
Proof-of-concept for a kelvin-emitter on-chip temperature sensor for power semiconductors
Baker, N., Iannuzzo, F., Beczkowski, S. & Kristensen, P. K., sep. 2019, Proceedings of 2019 21st European Conference on Power Electronics and Applications (EPE '19 ECCE Europe). IEEE Signal Processing Society, 8 s. 8914963Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review
1 Citationer (Scopus) -
The Temperature Dependence of the Flatband Voltage in High Power IGBTs
Baker, N. R. & Iannuzzo, F., jul. 2019, I: IEEE Transactions on Industrial Electronics. 66, 7, s. 5581 - 5584 4 s., 8411445.Publikation: Bidrag til tidsskrift › Letter › Forskning › peer review
Åben adgangFil17 Citationer (Scopus)196 Downloads (Pure)