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Publikationer 2013 2019

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Konferenceartikel i proceeding
2018
15 Downloads (Pure)

Impact of Kelvin-Source Resistors on Current Sharing and Failure Detection in Multichip Power Modules

Baker, N., Iannuzzo, F. & Li, H., sep. 2018, Proceedings of the 2018 20th European Conference on Power Electronics and Applications, EPE'18 ECCE Europe. IEEE Press, s. 1-7 7 s. 8515541

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

Åben adgang
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Resistors
Sensors
Electric current control
Silicon carbide
Semiconductor materials
2016

Experimental Evaluation of IGBT Junction Temperature Measurement via a Modified-VCE (ΔVCE_ΔVGE) Method with Series Resistance Removal

Baker, N., Iannuzzo, F., Munk-Nielsen, S., Dupont, L. & Avenas, Y., mar. 2016, Proceedings of CIPS 2016; 9th International Conference on Integrated Power Electronics Systems. VDE Verlag GMBH, 6 s.

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

Insulated gate bipolar transistors (IGBT)
Temperature measurement
Packaging materials
Electric potential
Temperature
2015
6 Citationer (Scopus)

Experimental evaluation of IGBT junction temperature measurement via peak gate current

Baker, N., Munk-Nielsen, S., Iannuzzo, F., Dupont, L. & Liserre, M., sep. 2015, 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe), 2015. IEEE Press, s. 1-11 11 s.

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

temperature measurement
evaluation
temperature
low currents
packaging
10 Citationer (Scopus)

Online junction temperature measurement using peak gate current

Baker, N., Munk-Nielsen, S., Iannuzzo, F. & Liserre, M., mar. 2015, Proceedings of the 2015 IEEE Applied Power Electronics Conference and Exposition (APEC). IEEE Press, s. 1270-1275 6 s. 7104511. (I E E E Applied Power Electronics Conference and Exposition. Conference Proceedings).

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

temperature measurement
frequency measurement
electric potential
resistors
converters
8 Citationer (Scopus)

Vce-based methods for temperature estimation of high power IGBT modules during power cycling - A comparison

Amoiridis, A., Anurag, A., Ghimire, P., Munk-Nielsen, S. & Baker, N., sep. 2015, Proceedings of the 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe). IEEE Press, 9 s.

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

Insulated gate bipolar transistors (IGBT)
Temperature
Voltage drop
2014
26 Citationer (Scopus)

Online junction temperature measurement via internal gate resistance during turn-on

Baker, N., Munk-Nielsen, S., Liserre, M. & Iannuzzo, F., aug. 2014, Power Electronics and Applications (EPE'14-ECCE Europe), 2014 16th European Conference on. IEEE Press, 10 s.

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

Temperature measurement
Semiconductor switches
Insulated gate bipolar transistors (IGBT)
Temperature
Networks (circuits)
2013
30 Citationer (Scopus)

Junction temperature measurements via thermo-sensitive electrical parameters and their application to condition monitoring and active thermal control of power converters

Baker, N., Liserre, M., Dupont, L. & Avenas, Y., nov. 2013, Proceedings of the 39th Annual Conference of the IEEE Industrial Electronics Society, IECON 2013. IEEE Press, s. 942-948 7 s. 6699260. (Proceedings of the Annual Conference of the IEEE Industrial Electronics Society).

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

Condition monitoring
Power converters
Temperature measurement
Temperature
Power electronics
13 Citationer (Scopus)

Test setup for long term reliability investigation of Silicon Carbide MOSFETs

Baker, N., Munk-Nielsen, S. & Beczkowski, S., 2013, Proceedings of the 15th European Conference on Power Electronics and Applications, EPE 2013. IEEE Press, 9 s.

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

Silicon carbide
Voltage measurement
Power electronics
Degradation
Silicon