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Publikationer 2013 2019

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Tidsskriftartikel
2019
6 Downloads (Pure)

Study of Current Density Influence on Bond Wire Degradation Rate in SiC MOSFET Modules

Luo, H., Iannuzzo, F., Baker, N., Blaabjerg, F., Li, W. & He, X., jun. 2019, I : IEEE Journal of Emerging and Selected Topics in Power Electronics.

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Silicon carbide
Current density
Wire
Degradation
Aging of materials
2 Citationer (Scopus)
56 Downloads (Pure)

The Temperature Dependence of the Flatband Voltage in High Power IGBTs

Baker, N. R. & Iannuzzo, F., jul. 2019, I : IEEE Transactions on Industrial Electronics. 66, 7, s. 5581 - 5584 4 s.

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Insulated gate bipolar transistors (IGBT)
Electric potential
Temperature
Temperature measurement
Power bipolar transistors
2017
21 Citationer (Scopus)

IR Camera Validation of IGBT Junction Temperature Measurement via Peak Gate Current

Baker, N., Dupont, L., Munk-Nielsen, S., Iannuzzo, F. & Liserre, M., apr. 2017, I : I E E E Transactions on Power Electronics. 32, 4, s. 3099 - 3111 13 s.

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Insulated gate bipolar transistors (IGBT)
Temperature measurement
Cameras
Temperature
Temperature distribution
11 Citationer (Scopus)
115 Downloads (Pure)

Simultaneous On-State Voltage and Bond-Wire Resistance Monitoring of Silicon Carbide MOSFETs

Baker, N., Luo, H. & Iannuzzo, F., mar. 2017, I : Energies. 10, 3, 8 s.

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Field-effect Transistor
MOSFET devices
Silicon carbide
Oxides
Semiconductors
2016
37 Citationer (Scopus)

IGBT Junction Temperature Measurement via Peak Gate Current

Baker, N., Munk-Nielsen, S., Iannuzzo, F. & Liserre, M., maj 2016, I : IEEE Transactions on Power Electronics. 31, 5, s. 3784-3793 10 s., 7180393.

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Insulated gate bipolar transistors (IGBT)
Temperature measurement
MOS devices
Electric potential
Resistors
2015
26 Citationer (Scopus)

Condition Monitoring: A Decade of Proposed Techniques

Avenas, Y., Dupont, L., Baker, N., Zara, H. & Barruel, F., dec. 2015, I : I E E E Industrial Electronics Magazine. 9, 4, s. 22-36

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Condition monitoring
Static converters
Redundancy
Power plants
Costs
2014
74 Citationer (Scopus)

Improved reliability of power modules: A review of online junction temperature measurement methods

Baker, N., Liserre, M., Dupont, L. & Avenas, Y., 1 sep. 2014, I : IEEE Industrial Electronics Magazine. 8, 3, s. 17-27 11 s., 6899789.

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Electric vehicles
Power electronics
Temperature measurement
Aerospace industry
Power quality