• Pontoppidanstræde 101, 72

    9220 Aalborg Ø

    Danmark

20162021
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Teknik og materialevidenskab

Short circuit currents
Leakage currents
Power electronics
Degradation
Temperature
Topology
Physics
Failure analysis
Power MOSFET
Insulated gate bipolar transistors (IGBT)
Light emission
MOSFET devices
Temperature distribution
Networks (circuits)
MATLAB
Thermoanalysis
Failure modes
Electric potential
Silicon
Semiconductor materials
Hot Temperature
Diodes
Parameter extraction
Silicon carbide
Focused ion beams
Finite element method
Energy dissipation
Aluminum
Computer simulation
Power converters
Threshold voltage
Reliability analysis
Bias voltage
Switches
Computer hardware description languages
Defects
Cracks
Photoemission
Graphical user interfaces
Photodiodes
Electric breakdown
Specifications

Fysik og astronomi

Engineering

short circuits
field effect transistors
failure modes
static characteristics
diodes

General

degradation
light emission
leakage
ruggedness
conduction

Physics

cycles
temperature

Kemiske forbindelser

Short circuit currents
Degradation
Leakage currents
Light emission
Failure modes
Diodes
Silicon
Aluminum
Power MOSFET
Temperature
Defects
Focused ion beams
Photoemission
Bias voltage
Photodiodes