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    Danmark

20182019
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Publikationer 2018 2019

  • 2 Konferenceartikel i tidsskrift
  • 1 Konferenceartikel i proceeding
2019
5 Downloads (Pure)

Impact of the Case Temperature on the Reliability of SiC MOSFETs Under Repetitive Short Circuit Tests

Du, H., Reigosa, P. D., Iannuzzo, F. & Ceccarelli, L., mar. 2019, Proceedings of 2019 IEEE Annual Applied Power Electronics Conference and Exposition (APEC 2019). IEEE Press, s. 332-337 6 s.

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

Åben adgang
Fil
Short circuit currents
Temperature
Bias voltage
Leakage currents
Wire

Implications of short-circuit events on power cycling of 1.2-kV/20-A SiC MOSFET power modules

Du, H., Ceccarelli, L., Iannuzzo, F. & Reigosa, P. D., 2019, (Accepteret/In press) I : Microelectronics Reliability.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

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Fil
short circuits
Short circuit currents
field effect transistors
cycles
degradation
2018
1 Citation (Scopus)
20 Downloads (Pure)

Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules

Du, H., Reigosa, P. D., Iannuzzo, F. & Ceccarelli, L., 1 sep. 2018, I : Microelectronics Reliability. 88-90, s. 661-665 5 s.

Publikation: Bidrag til tidsskriftKonferenceartikel i tidsskriftForskningpeer review

short circuits
Short circuit currents
field effect transistors
static characteristics
degradation