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Projekter
- 1 Igangværende
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Physics-informed Data-driven Methods for Reliability Test and Analysis of Semiconductor Switches in Power Converters
01/11/2021 → 31/10/2024
Projekter: Projekt › Ph.d.-projekt
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An Estimation Method of High-order LC Circuits in Power Electronic Converters
Bo, Y., Peng, Y., Zhang, Y., Wang, H. & Wang, H., 1 maj 2024, I: I E E E Transactions on Industrial Electronics. 71, 5, s. 5274-5284 11 s., 10155667.Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review
Åben adgangFil -
Figures-of-Merit Study for Thermal Transient Measurement of SiC MOSFETs
Zhang, Y., Zhang, Y., Wong, V. H., Kalker, S., Caruso, A., Ruppert, L., Iannuzzo, F. & Doncker, R. W. D., 2024, I: IEEE Transactions on Power Electronics . PP, 99, s. 1-13 13 s., 10483537.Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review
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gEOL: A Gradient-based End-of-Life Criterion for Power Semiconductor Modules
Zhang, Y., Zhang, Y. & Wang, H., 1 mar. 2024, I: IEEE Transactions on Power Electronics . 39, 3, s. 2927-2931 5 s.Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review
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Guideline for Reproducible SiC MOSFET Thermal Characterization Based on Source-Drain Voltage
Zhang, Y., Zhang, Y., Xu, Z., Wang, Z., Wong, V. H., Lu, Z. & Caruso, A., 2024, I: IEEE Transactions on Industry Applications. PP, 99, s. 1-10 10 s., 10387730.Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review
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Accelerated degradation testing and failure phenomenon of metalized film capacitors for AC filtering
Yao, B., Zhang, Y., Correia, P., Wu, R., Song, S., Trintis, I., Wang, H. & Wang, H., mar. 2023, APEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition. IEEE, s. 1846-1850 5 s. (I E E E Applied Power Electronics Conference and Exposition. Conference Proceedings).Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review
1 Citationer (Scopus)
Forskningsdatasæt
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POWER CYCLING TEST DATASET (GEOL: A GRADIENT-BASED END-OF-LIFE CRITERION FOR POWER SEMICONDUCTOR MODULES)
Zhang, Y. (Bidrager), Zhang, Y. (Ophavsperson) & Wang, H. (Bidrager), IEEE DataPort, 1 dec. 2023
DOI: 10.21227/ksrt-zq09, https://ieee-dataport.org/documents/power-cycling-test-dataset-geol-gradient-based-end-life-criterion-power-semiconductor
Datasæt
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