Projekter pr. år
Personlig profil
Forskningsprofil
Yichi Zhang received the B.S. degree in electrical engineering from Shenyang Agricultural University (SYAU), Shenyang, China, in 2017, the M.S. degree in power electronics from Southwest Jiaotong University (SWJTU), Chengdu, China, in 2021, the Ph.D. degree in power electronic from Aalborg University (AAU), Aalborg, Denmark, 2024. From March to June 2024, he was a Visiting Researcher with the Institute for Power Electronics and Electrical Drives (ISEA) at RWTH Aachen, Aachen, Germany. He is currently a Postdoctoral Researcher with the Department of Energy, Aalborg University. His research interests include failure mechanism analysis, physics-informed and data-driven-based degradation modeling, thermal modeling, and condition monitoring of semiconductor switches in power electronics.
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Projekter
- 1 Afsluttet
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Physics-informed Data-driven Methods for Reliability Test and Analysis of Semiconductor Switches in Power Converters
Zhang, Y. (PI (principal investigator)) & Wang, H. (Supervisor)
01/11/2021 → 31/10/2024
Projekter: Projekt › Ph.d.-projekt
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Physics-informed Neural Network Approach for Early Degradation Trajectory Prediction of Power Semiconductor Modules
Kong, J., Zhang, Y., Zhang, Y., Wick, L. Y., Hansen, F. L., Zhou, D. & Wang, H., 1 maj 2025, 2025 IEEE Applied Power Electronics Conference and Exposition (APEC). IEEE (Institute of Electrical and Electronics Engineers), s. 2380-2386 7 s.Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review
Åben adgangFil54 Downloads (Pure) -
Accelerated Degradation Testing and Failure Mechanism Analysis of Metallized Film Capacitors for AC Filtering
Yao, B., Wei, X., Zhang, Y., Correia, P., Wu, R., Song, S., Trintis, I., Wang, H. & Wang, H., 1 maj 2024, I: IEEE Transactions on Power Electronics . 39, 5, s. 6256-6270 15 s., 10416696.Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review
17 Citationer (Scopus) -
An Estimation Method of High-order LC Circuits in Power Electronic Converters
Bo, Y., Peng, Y., Zhang, Y., Wang, H. & Wang, H., 1 maj 2024, I: I E E E Transactions on Industrial Electronics. 71, 5, s. 5274-5284 11 s., 10155667.Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review
Åben adgangFil4 Citationer (Scopus)79 Downloads (Pure) -
An Online Gate Oxide Degradation Monitoring Method for SiC Mosfets Based on Turn-On Gate Voltage Filtering
Liu, J., Yao, B., Wei, X., Zhang, Y. & Wang, H., 1 maj 2024, I: IEEE Transactions on Power Electronics . 39, 5, s. 5020-5026 7 s., 10423833.Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review
8 Citationer (Scopus) -
Figures-of-Merit Study for Thermal Transient Measurement of SiC MOSFETs
Zhang, Y., Zhang, Y., Wong, V. H., Kalker, S., Caruso, A., Ruppert, L., Iannuzzo, F. & Doncker, R. W. D., 2024, I: IEEE Transactions on Power Electronics . 39, 9, s. 11583-11595 13 s., 10483537.Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review
Åben adgangFil3 Citationer (Scopus)23 Downloads (Pure)
Forskningsdatasæt
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POWER CYCLING TEST DATASET (GEOL: A GRADIENT-BASED END-OF-LIFE CRITERION FOR POWER SEMICONDUCTOR MODULES)
Zhang, Y. (Bidrager), Zhang, Y. (Ophavsperson) & Wang, H. (Bidrager), IEEE DataPort, 1 dec. 2023
DOI: 10.21227/ksrt-zq09, https://ieee-dataport.org/documents/power-cycling-test-dataset-geol-gradient-based-end-life-criterion-power-semiconductor
Datasæt
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