Engineering
Pulse Test
100%
SPICE
90%
Test Setup
90%
Metal-Oxide-Semiconductor Field-Effect Transistor
90%
Design Process
77%
Parasitic Element
68%
Parameter Variation
54%
Energy Gap
45%
Convolutional Neural Network
45%
Consuming Process
45%
Experimental Parameter
45%
Source Resistance
45%
Convergence Problem
45%
Power Electronics
31%
Wide Bandgap Semiconductor
31%
Experimental Measurement
22%
Rise Time
22%
Prototype
22%
Design Optimization
22%
Layout Optimization
22%
Printed Circuit Board
22%
Negative Effect
22%
Space Solution
9%
Error Convergence
9%
Test Circuit
9%
Design Space
9%
Fits and Tolerances
9%
Transient Analysis
9%
Electronic Design
9%
Circuit Element
9%
Initial Condition
9%
Keyphrases
Circuit Optimization
45%
Automated Design
45%
Wide Bandgap Devices
45%
Gate Impedance
45%
Digital Twin
45%
Measured Signal
22%
Design Optimization
22%
GHz Range
22%
Generated Data
22%
Die Parameters
22%
Inductance Extraction
22%
Early Estimation
22%
Appropriate Responses
22%
Temperature Robustness
22%
Rise Time
22%
Design Automation
22%
Increased Temperature
22%
Design Process
22%
Measurement Accuracy
22%
Size Reduction
22%
Blocking Voltage
22%
Power Electronic Systems
22%
Time to Market
22%
Signal Frequency
22%
Convergence Error
9%
A-number
9%
Computer Science
Digital Twin
45%
Convolutional Neural Network
45%
Circuit Element
45%
Not a Number
45%
Time Consumption
22%
Design Optimization
22%
Electronic System
22%
Negative Effect
22%
Design Automation
22%
Signal Frequency
22%
Printed Circuit Board
22%
Parasitic Element
22%