Skanning nærfeltsoptisk mikroskopi af fotoniske krystaller / Scanning Near-Field Optical Microscopy of Photonic Crystals

Scanning near-field optical microscopy (SNOM) technique is employed for high resolution mapping of light propagation in various photonic crystal (PC) structures. Using SNOM imaging straight and bent PC waveguides based on silicon-on-insulator technology are investigated for different wavelengths and waveguide parameters. The SNOM images obtained are used for characterisation of the PC structures, e.g., for determination of the propagation and bend losses in PC waveguides at telecommunication wavelengths. The SNOM imaging of PC waveguides is carried out in the framework of the European project Photonics Integrated Components based on Crystal Optics (PICCO) in collaboration with COM. Technical University of Denmark, and partially supported by the Danish Technical Research Council, contract No. 6-00-0329. (Sergey I. Bozhevolnyi, Valentyn S. Volkov)