A Bayesian approach to crack detection in electrically conducting media

Kim Emil Andersen, Stephen P. Brooks, Martin Bøgsted Hansen

Publikation: Bog/antologi/afhandling/rapportRapportForskning

OriginalsprogEngelsk
UdgivelsesstedAalborg
ForlagAalborg Universitetsforlag
StatusUdgivet - 2000
NavnResearch Report Series
NummerR-00-2019
ISSN1399-2503

Citationsformater