Projekter pr. år
Abstract
Compact modeling of P+ contact resistances is
important for characterization of substrate noise coupling in
mixed-signal System on Chips (SoCs). Existing contact resistance
models can handle uniformly doped bulk or epitaxial substrates.
However, compact contact resistance models feasible for modern
lightly-doped CMOS processes with P-well layers are still unavailable.
This paper presents a new compact resistance model aiming
at solving this problem. A Conformal Mapping(CM) method was
used to derive the closed-form expressions for the resistances in
the model. The model requires no fitting factors, and it is scalable
to layout/substrate parameters. The proposed model can also be
used to predict noise coupling in terms of S-parameters. The
model validation has been done by both EM simulations and
measurements, and satisfactory agreement is found between the
modeled and measured resistances as well as S-parameters.
important for characterization of substrate noise coupling in
mixed-signal System on Chips (SoCs). Existing contact resistance
models can handle uniformly doped bulk or epitaxial substrates.
However, compact contact resistance models feasible for modern
lightly-doped CMOS processes with P-well layers are still unavailable.
This paper presents a new compact resistance model aiming
at solving this problem. A Conformal Mapping(CM) method was
used to derive the closed-form expressions for the resistances in
the model. The model requires no fitting factors, and it is scalable
to layout/substrate parameters. The proposed model can also be
used to predict noise coupling in terms of S-parameters. The
model validation has been done by both EM simulations and
measurements, and satisfactory agreement is found between the
modeled and measured resistances as well as S-parameters.
Originalsprog | Engelsk |
---|---|
Titel | European Microwave Week 2012 Conference Proceedings |
Forlag | EuMA |
Publikationsdato | 2012 |
ISBN (Elektronisk) | 978-2-87487-028-6 |
Status | Udgivet - 2012 |
Begivenhed | European Microwave Integrated Circuits Conference 2012 - Amsterdam, Holland Varighed: 29 okt. 2012 → 30 okt. 2012 |
Konference
Konference | European Microwave Integrated Circuits Conference 2012 |
---|---|
Land/Område | Holland |
By | Amsterdam |
Periode | 29/10/2012 → 30/10/2012 |
Fingeraftryk
Dyk ned i forskningsemnerne om 'A Compact P⁺ Contact Resistance Model for Characterization of Substrate Coupling in Modern Lightly Doped CMOS Processes'. Sammen danner de et unikt fingeraftryk.Projekter
- 1 Afsluttet
-
Microwatt Radio for Self-Sustaining Wireless Sensor Networks
The Danish Council for Independent Research, Technology and Production Sciences. Individual Post-doc
01/01/2011 → 30/04/2014
Projekter: Projekt › Forskning