A Measurement Fixture Suitable for measuring Substrate Noise in the UWB Frequency Band

Ming Shen; Tian Tong; Jan H. Mikkelsen; Torben Larsen

doi:10.1007/s10470-008-9181-x

A Measurement Fixture Suitable for measuring Substrate Noise in the UWB Frequency Band

Ming Shen, Tian Tong, Jan H. Mikkelsen, Torben Larsen

Institut for Elektroniske Systemer

Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review

4 Citationer (Scopus)

480 Downloads (Pure)

Abstract

Udgivelsesdato: JAN

Originalsprog	Engelsk
Tidsskrift	Analog Integrated Circuits and Signal Processing
Vol/bind	58
Udgave nummer	1
Sider (fra-til)	11-17
ISSN	0925-1030
DOI	https://doi.org/10.1007/s10470-008-9181-x
Status	Udgivet - 2009

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10.1007/s10470-008-9181-x

A measurement fixture suitable for measuring substrate noise in the UWB frequency band_VBNAccepteret manuskript, 1,22 MB

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Citationsformater

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abstract = "Udgivelsesdato: JAN",

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TY - JOUR

T1 - A Measurement Fixture Suitable for measuring Substrate Noise in the UWB Frequency Band

AU - Shen, Ming

AU - Tong, Tian

AU - Mikkelsen, Jan H.

AU - Larsen, Torben

PY - 2009

Y1 - 2009

N2 - Udgivelsesdato: JAN

AB - Udgivelsesdato: JAN

U2 - 10.1007/s10470-008-9181-x

DO - 10.1007/s10470-008-9181-x

M3 - Journal article

SN - 0925-1030

VL - 58

SP - 11

EP - 17

JO - Analog Integrated Circuits and Signal Processing

JF - Analog Integrated Circuits and Signal Processing

IS - 1

ER -