A mission profile-based reliability analysis framework for photovoltaic DC-DC converters

Wieland Van De Sande, Simon Ravyts, Ariya Sangwongwanich, Patrizio Manganiello, Yongheng Yang, Frede Blaabjerg, Johan Driesen, Michael Daenen

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

2 Citationer (Scopus)

Abstrakt

Reliability of DC-DC converters is important in photovoltaic (PV) applications like building integrated PV systems, where the module-level converter may be stressed significantly. Understanding and predicting the most life-limiting components with accurate degradation models in such systems enable the design for reliability. In this paper, a mission profile-based reliability analysis framework for PV DC-DC converters is proposed where the inputs and models of the framework can be adjusted according to the converter topology, the components and the failure mechanisms under investigation. The framework is demonstrated by comparing the influence of two yearly mission profiles on the solder joint degradation of a MOSFET in an interleaved boost converter. This is done by using an electro-thermal circuit simulation in PLECS and a finite element MOSFET model in COMSOL. This framework allows for exploring more accurate models or even simplifying parts with low sensitivity in order to obtain a thorough understanding of their accuracy and to determine the overall converter reliability.
OriginalsprogEngelsk
Artikelnummer113383
TidsskriftMicroelectronics Reliability
Vol/bind100-101
Sider (fra-til)1-5
Antal sider5
ISSN0026-2714
DOI
StatusUdgivet - sep. 2019

Fingeraftryk Dyk ned i forskningsemnerne om 'A mission profile-based reliability analysis framework for photovoltaic DC-DC converters'. Sammen danner de et unikt fingeraftryk.

Citationsformater