A model based, daylight and chroma adaptive segmentation method

Hans Jørgen Andersen, C. M. Onyango, Erik Granum

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskning

OriginalsprogEngelsk
TitelEOS/SPIE Conference on Polarisation and Colour Techniques in Industrial Inspection : Proceedings, 14-18 June 1999, Munich, Germany
Publikationsdato1999
StatusUdgivet - 1999

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