A multi-port thermal coupling model for multi-chip power modules suitable for circuit simulators

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Abstract

This paper investigates two compact thermal model representations for multi-chip power modules, namely the thermal impedance matrix model and the thermal admittance matrix model. The latter can shape a multi-port thermal network without controlled temperature sources, and can be readily implemented in circuit simulators. The mutual transformation between the two models and their relationship to parameters in the multi-port network are revealed. In addition, practical tips for thermal model parameter extractions based on temperature measurements and curve-fitting are discussed. The multi-port thermal model is verified by simulations and experimental results. It confirms that more accurate temperature estimation can be achieved compared with the thermal model without the thermal coupling effect.
OriginalsprogEngelsk
TidsskriftMicroelectronics Reliability
Vol/bind88-90
Sider (fra-til)519-523
Antal sider5
ISSN0026-2714
DOI
StatusUdgivet - sep. 2018
Begivenhed29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - AKKC, Aalborg, Danmark
Varighed: 1 okt. 20185 okt. 2018
Konferencens nummer: 29th
http://www.esref2018conf.org/

Konference

Konference29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
Nummer29th
LokationAKKC
Land/OmrådeDanmark
ByAalborg
Periode01/10/201805/10/2018
Internetadresse

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